Semi-supervised Embedding in Attributed Networks with Outliers

In this paper, we propose a novel framework, called Semi-supervised Embedding in Attributed Networks with Outliers (SEANO), to learn a low-dimensional vector representation that systematically captures the topological proximity, attribute affinity and label similarity of vertices in a partially labeled attributed network (PLAN). Our method is designed to work in both transductive and inductive settings while explicitly alleviating noise effects from outliers. Experimental results on various datasets drawn from the web, text and image domains demonstrate the advantages of SEANO over state-of-the-art methods in semi-supervised classification under transductive as well as inductive settings. We also show that a subset of parameters in SEANO is interpretable as outlier score and can significantly outperform baseline methods when applied for detecting network outliers. Finally, we present the use of SEANO in a challenging real-world setting -- flood mapping of satellite images and show that it is able to outperform modern remote sensing algorithms for this task.Comment: in Proceedings of SIAM International Conference on Data Mining (SDM'18

Graph Summarization

The continuous and rapid growth of highly interconnected datasets, which are both voluminous and complex, calls for the development of adequate processing and analytical techniques. One method for condensing and simplifying such datasets is graph summarization. It denotes a series of application-specific algorithms designed to transform graphs into more compact representations while preserving structural patterns, query answers, or specific property distributions. As this problem is common to several areas studying graph topologies, different approaches, such as clustering, compression, sampling, or influence detection, have been proposed, primarily based on statistical and optimization methods. The focus of our chapter is to pinpoint the main graph summarization methods, but especially to focus on the most recent approaches and novel research trends on this topic, not yet covered by previous surveys.Comment: To appear in the Encyclopedia of Big Data Technologie