Influence of PVT variation and threshold selection on OBT and OBIST fault detection in RFCMOS amplifiers

Please read abstract in the article.The NRF/F.RS.-FNRS South Africa–Wallonia Joint Science and Technology Research Collaboration.https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=8784029hj2024Electrical, Electronic and Computer EngineeringSDG-09: Industry, innovation and infrastructur

RF Front-End Test Using Built-in Sensors

International audienceThis article proposes a new class of sensors for built-in test in RF devices. These sensors are placed in close proximity to the DUT on the same substrate without being electrically connected to it. Instead, they monitor it by virtue of being subjected to the same process variations. The authors also describe other types of sensors they have studied, including DC probes, an envelope detector, and a current sensor