Photocharge-Modulated Passive Intermodulation on Ag₂O/Ag Junction in High-Power Microwave Devices

This letter studies the photocharge-modulated passive intermodulation (PIM) effect on the Ag2O/Ag contact junction. It is demonstrated that the photocharge with the parasitic parameters on the contact junction can modulate the electron transport process and make the PIM components changed with photoillumination. The linear RC constant can change the nonlinear current strength, under the periodical photostimulation, and PIM components will vary with the photopulses. In the experiment, by using a specially designed coaxial fixture to measure the PIM response with RC components on the contact junction, a semianalytical model for this photoeffect-modulated contact PIM is demonstrated

Conference on Charge-Coupled Device Technology and Applications

Papers were presented from the conference on charge coupled device technology and applications. The following topics were investigated: data processing; infrared; devices and testing; electron-in, x-ray, radiation; and applications. The emphasis was on the advances of mutual relevance and potential significance both to industry and NASA's current and future requirements in all fields of imaging, signal processing and memory