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1 research outputs found
Pattern Similarity Metrics for Layout Pattern Classification and their Validity Analysis by Lithographic Responses
Author
Ogura Hiroki
Sato Shimpei
+4 more
TAKAHASHI Atsushi
佐藤 真平
小椋 弘貴
高橋 篤司
Publication venue
'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
02/10/2018
Field of study
No full text
Institutional Repositories DataBase (IRDB)