Area-Efficient Spin-Orbit Torque Magnetic Random-Access Memory

Spin-orbit torque magnetic random-access memory (SOT-MRAM) has shown promising potential to realize reliable, high-speed and energy-efficient on-chip memory. However, conventional SOT-MRAM requires two access transistors per cell. This limits the use of conventional SOT-MRAM in high-density memories. Thus, various architectures in the literature have been proposed to improve the area efficiency of the SOT-MRAM. In this chapter, these proposals are divided into two categories: non-diode-based SOT-MRAM and diode-based SOT-MRAM cells. The non-diode-based proposals may result in a 1-bit effective area saving up to 50% compared to the conventional SOT-MRAM, whereas the diode-based designs may result in 1-bit effective area-saving of up to 75%. However, the area saving may be accompanied by higher energy and reliability issue penalties. Therefore, here, the various proposals in the literature are presented, highlighting the pros and cons of each design. Moreover, the technology requirements to realize these proposals are discussed. Finally, the various designs are evaluated from both cell and system level perspectives

Design and Robustness Analysis on Non-volatile Storage and Logic Circuit

By combining the flexibility of MOS logic and the non-volatility of spintronic devices, spin-MOS logic and storage circuitry offer a promising approach to implement highly integrated, power-efficient, and nonvolatile computing and storage systems. Besides the persistent errors due to process variations, however, the functional correctness of Spin-MOS circuitry suffers from additional non-persistent errors that are incurred by the randomness of spintronic device operations, i.e., thermal fluctuations. This work quantitatively investigates the impact of thermal fluctuations on the operations of two typical Spin-MOS circuitry: one transistor and one magnetic tunnel junction (1T1J) spin-transfer torque random access memory (STT-RAM) cell and a nonvolatile latch design. A new nonvolatile latch design is proposed based on magnetic tunneling junction (MTJ) devices. In the standby mode, the latched data can be retained in the MTJs without consuming any power. Two types of operation errors can occur, namely, persistent and non-persistent errors. These are quantitatively analyzed by including models for process variations and thermal fluctuations during the read and write operations. A mixture importance sampling methodology is applied to enable yield-driven design and extend its application beyond memories to peripheral circuits and logic blocks. Several possible design techniques to reduce thermal induced non-persistent error rate are also discussed

TL-nvSRAM-CIM: Ultra-High-Density Three-Level ReRAM-Assisted Computing-in-nvSRAM with DC-Power Free Restore and Ternary MAC Operations

Accommodating all the weights on-chip for large-scale NNs remains a great challenge for SRAM based computing-in-memory (SRAM-CIM) with limited on-chip capacity. Previous non-volatile SRAM-CIM (nvSRAM-CIM) addresses this issue by integrating high-density single-level ReRAMs on the top of high-efficiency SRAM-CIM for weight storage to eliminate the off-chip memory access. However, previous SL-nvSRAM-CIM suffers from poor scalability for an increased number of SL-ReRAMs and limited computing efficiency. To overcome these challenges, this work proposes an ultra-high-density three-level ReRAMs-assisted computing-in-nonvolatile-SRAM (TL-nvSRAM-CIM) scheme for large NN models. The clustered n-selector-n-ReRAM (cluster-nSnRs) is employed for reliable weight-restore with eliminated DC power. Furthermore, a ternary SRAM-CIM mechanism with differential computing scheme is proposed for energy-efficient ternary MAC operations while preserving high NN accuracy. The proposed TL-nvSRAM-CIM achieves 7.8x higher storage density, compared with the state-of-art works. Moreover, TL-nvSRAM-CIM shows up to 2.9x and 1.9x enhanced energy-efficiency, respectively, compared to the baseline designs of SRAM-CIM and ReRAM-CIM, respectively

An Energy-Efficient Design Paradigm for a Memory Cell Based on Novel Nanoelectromechanical Switches

In this chapter, we explain NEMsCAM cell, a new content-addressable memory (CAM) cell, which is designed based on both CMOS technologies and nanoelectromechanical (NEM) switches. The memory part of NEMsCAM is designed with two complementary nonvolatile NEM switches and located on top of the CMOS-based comparison component. As a use case, we evaluate first-level instruction and data translation lookaside buffers (TLBs) with 16 nm CMOS technology at 2 GHz. The simulation results demonstrate that the NEMsCAM TLB reduces the energy consumption per search operation (by 27%), standby mode (by 53.9%), write operation (by 41.9%), and the area (by 40.5%) compared to a CMOS-only TLB with minimal performance overhead