1 research outputs found
Delay Measurements and Self Characterisation on FPGAs
This thesis examines new timing measurement methods for self delay characterisation of Field-Programmable Gate Arrays (FPGAs) components and delay measurement of complex circuits
on FPGAs. Two novel measurement techniques based on analysis of a circuit's output failure
rate and transition probability is proposed for accurate, precise and efficient measurement of
propagation delays. The transition probability based method is especially attractive, since
it requires no modifications in the circuit-under-test and requires little hardware resources,
making it an ideal method for physical delay analysis of FPGA circuits.
The relentless advancements in process technology has led to smaller and denser transistors
in integrated circuits. While FPGA users benefit from this in terms of increased hardware
resources for more complex designs, the actual productivity with FPGA in terms of timing
performance (operating frequency, latency and throughput) has lagged behind the potential
improvements from the improved technology due to delay variability in FPGA components
and the inaccuracy of timing models used in FPGA timing analysis. The ability to measure
delay of any arbitrary circuit on FPGA offers many opportunities for on-chip characterisation
and physical timing analysis, allowing delay variability to be accurately tracked and variation-aware optimisations to be developed, reducing the productivity gap observed in today's FPGA
designs.
The measurement techniques are developed into complete self measurement and characterisation platforms in this thesis, demonstrating their practical uses in actual FPGA hardware for
cross-chip delay characterisation and accurate delay measurement of both complex combinatorial and sequential circuits, further reinforcing their positions in solving the delay variability
problem in FPGAs