A Programmable Window Comparator for Analog Online Testing

This paper discusses the challenge of designing window comparators for analog online testing applications. A programmable window comparator with adaptive error threshold is presented. Experimental results demonstrate that improved fault detection capability is achieved by using the proposed design. Measurement results of the fabricated comparator circuit are also presented

On-line Testing Field Programmable Analog Array Circuits

This work presents an efficient methodology to on-line test field programmable analog array (FPAA) circuits. It proposes to partition the FPAA circuit under test into sub circuits. Each sub circuit is tested by replicating the sub circuit with programmable resources on FPAAs, and comparing the outputs of the original partitioned sub circuit and its replication. The advantages of this approach includes: low implementation cost, enhanced testability, and flexible testing schedules. This work also presents circuit techniques to address stability problems which are often encountered in the proposed on-line testing approach. In addition, the impact of performing circuit partition on testability is investigated in this work. It shows that testability is generally improved in partitioned circuits. Finally, experimental results are presented to demonstrate the feasibility and effectiveness of the proposed techniques

A Methodology to Perform Online Self-Testing for Field-Programmable Analog Array Circuits

This paper presents a methodology to perform online self-testing for analog circuits implemented on field-programmable analog arrays (FPAAs). It proposes to partition the FPAA circuit under test into subcircuits. Each subcircuit is tested by replicating the subcircuit with programmable resources on the FPAA chip, and comparing the outputs of the subcircuit and its replication. To effectively implement the proposed methodology, this paper proposes a simple circuit partition method and develops techniques to address circuit stability problems that are often encountered in the proposed testing method. Furthermore, error sources in the proposed testing circuit are studied and methods to improve the accuracy of testing results are presented. Finally, experimental results are presented to demonstrate the validity of the proposed methodology

On Fault Tolerance Methods for Networks-on-Chip

Technology scaling has proceeded into dimensions in which the reliability of manufactured devices is becoming endangered. The reliability decrease is a consequence of physical limitations, relative increase of variations, and decreasing noise margins, among others. A promising solution for bringing the reliability of circuits back to a desired level is the use of design methods which introduce tolerance against possible faults in an integrated circuit. This thesis studies and presents fault tolerance methods for network-onchip (NoC) which is a design paradigm targeted for very large systems-onchip. In a NoC resources, such as processors and memories, are connected to a communication network; comparable to the Internet. Fault tolerance in such a system can be achieved at many abstraction levels. The thesis studies the origin of faults in modern technologies and explains the classification to transient, intermittent and permanent faults. A survey of fault tolerance methods is presented to demonstrate the diversity of available methods. Networks-on-chip are approached by exploring their main design choices: the selection of a topology, routing protocol, and flow control method. Fault tolerance methods for NoCs are studied at different layers of the OSI reference model. The data link layer provides a reliable communication link over a physical channel. Error control coding is an efficient fault tolerance method especially against transient faults at this abstraction level. Error control coding methods suitable for on-chip communication are studied and their implementations presented. Error control coding loses its effectiveness in the presence of intermittent and permanent faults. Therefore, other solutions against them are presented. The introduction of spare wires and split transmissions are shown to provide good tolerance against intermittent and permanent errors and their combination to error control coding is illustrated. At the network layer positioned above the data link layer, fault tolerance can be achieved with the design of fault tolerant network topologies and routing algorithms. Both of these approaches are presented in the thesis together with realizations in the both categories. The thesis concludes that an optimal fault tolerance solution contains carefully co-designed elements from different abstraction levelsSiirretty Doriast

Concurrent error detection in 2-D separable linear transform

As process technology continues to scale to smaller geometries and reduces the supply voltage, reliability of the resulting semiconductor becomes a greater concern. The effect of deep submicron noise, soft errors, variation, and aging degradation pose challenges on the functional correctness of VLSI systems and places roadblocks on reductions in scale. On the other side, as computing moves toward mobile, the energy efficiency of digital systems becomes one of the most important design metrics. However, reliability and energy efficiency are contradicting design requirements. Adding a voltage guard band is the most common method to mitigate the reliability impacts in such instances. Low power design technique like voltage over-scaling (VOS) even reduces the power by scaling the supply voltage just before data-dependant timing errors start to appear. Concurrent error detection is the solution to tackle reliability and energy-efficiency in a unified manner. Fault tolerance can be deployed at different design hierarchies. Given its low overhead, algorithm level error detection is an attractive approach. In this work, a generic weighted checksum code based error detection algorithm targeted generic 2-D separable linear transform is proposed. This technique encodes the input array at the 2-D linear trans- formation level, and algorithms are designed to operate on encoded data and produce encoded output data. The proposed error detection technique is a system-level method and therefore can be used in existing hardware or software 2-D linear transformation architectures with low overhead. The mathematic proof of the algorithm is provided within the scope of this dissertation. The checksum weighting vector for several common transforms are derived as examples, error detection cost and algorithm effectiveness are analyzed. In traditional fault tolerance study, the error is often evaluated at the boolean level. Many DSP applications, like 2-D linear transformation used in the multimedia compression system, do not require exactly correct results, but rather that the quality of the output is within the acceptable range. A generic quality aware error detection in the 2-D separable linear transform is proposed by extending the above property and defining the errors at the functional level. As an example, the quality-aware error detection technique is deployed on a low-power wavelet lifting transform architecture in JPEG2000. A low-cost Signal to Noise Ratio (SNR) aware detection logic based on proposed scheme is integrated into the discrete wavelet lifting transform architecture. This detection logic checks whether the image quality degradation caused by voltage over-scaling induced timing errors is acceptable and determines the optimal voltage set point in operating conditions at run time. This novel quality-based error detection approach is significantly different from traditional error detection schemes which look for exact data equivalence. A simulation result for one design shows that the supply voltage can be scaled down to 75% of the nominal voltage in typical process corner without significant image quality degradation, which translates to 9.15mW power consumption (44% power saving).Electrical and Computer Engineerin

From experiment to design – fault characterization and detection in parallel computer systems using computational accelerators

This dissertation summarizes experimental validation and co-design studies conducted to optimize the fault detection capabilities and overheads in hybrid computer systems (e.g., using CPUs and Graphics Processing Units, or GPUs), and consequently to improve the scalability of parallel computer systems using computational accelerators. The experimental validation studies were conducted to help us understand the failure characteristics of CPU-GPU hybrid computer systems under various types of hardware faults. The main characterization targets were faults that are difficult to detect and/or recover from, e.g., faults that cause long latency failures (Ch. 3), faults in dynamically allocated resources (Ch. 4), faults in GPUs (Ch. 5), faults in MPI programs (Ch. 6), and microarchitecture-level faults with specific timing features (Ch. 7). The co-design studies were based on the characterization results. One of the co-designed systems has a set of source-to-source translators that customize and strategically place error detectors in the source code of target GPU programs (Ch. 5). Another co-designed system uses an extension card to learn the normal behavioral and semantic execution patterns of message-passing processes executing on CPUs, and to detect abnormal behaviors of those parallel processes (Ch. 6). The third co-designed system is a co-processor that has a set of new instructions in order to support software-implemented fault detection techniques (Ch. 7). The work described in this dissertation gains more importance because heterogeneous processors have become an essential component of state-of-the-art supercomputers. GPUs were used in three of the five fastest supercomputers that were operating in 2011. Our work included comprehensive fault characterization studies in CPU-GPU hybrid computers. In CPUs, we monitored the target systems for a long period of time after injecting faults (a temporally comprehensive experiment), and injected faults into various types of program states that included dynamically allocated memory (to be spatially comprehensive). In GPUs, we used fault injection studies to demonstrate the importance of detecting silent data corruption (SDC) errors that are mainly due to the lack of fine-grained protections and the massive use of fault-insensitive data. This dissertation also presents transparent fault tolerance frameworks and techniques that are directly applicable to hybrid computers built using only commercial off-the-shelf hardware components. This dissertation shows that by developing understanding of the failure characteristics and error propagation paths of target programs, we were able to create fault tolerance frameworks and techniques that can quickly detect and recover from hardware faults with low performance and hardware overheads

Fault-tolerant computation using algebraic homomorphisms

Also issued as Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1992.Includes bibliographical references (p. 193-196).Supported by the Defense Advanced Research Projects Agency, monitored by the U.S. Navy Office of Naval Research. N00014-89-J-1489 Supported by the Charles S. Draper Laboratories. DL-H-418472Paul E. Beckmann

Algorithm Based Fault Tolerance in Massively Parallel Systems

An A complex computer system consists of billions of transistors, miles of wires, and many interactions with an unpredictable environment. Correct results must be produced despite faults that dynamically occur in some of these components. Many techniques have been developed for fault tolerant computation. General purpose methods are independent of the application, yet incur an overhead cost which may be unacceptable for massively parallel systems. Algorithm-specific methods, which can operate at lower cost, are a developing alternative [1, 72]. This paper first reviews the general-purpose approach and then focuses on the algorithm-specific method, with an eye toward massively parallel processors. Algorithm-based fault tolerance has the attraction of low overhead; furthermore it addresses both the detection and also the correction problems. The principle is to build low-cost checking and correcting mechanism based exclusively on the redundancies inherent in the system

Fault tolerance in space-based digital signal processing and switching systems: Protecting up-link processing resources, demultiplexer, demodulator, and decoder

Fault tolerance features in the first three major subsystems appearing in the next generation of communications satellites are described. These satellites will contain extensive but efficient high-speed processing and switching capabilities to support the low signal strengths associated with very small aperture terminals. The terminals' numerous data channels are combined through frequency division multiplexing (FDM) on the up-links and are protected individually by forward error-correcting (FEC) binary convolutional codes. The front-end processing resources, demultiplexer, demodulators, and FEC decoders extract all data channels which are then switched individually, multiplexed, and remodulated before retransmission to earth terminals through narrow beam spot antennas. Algorithm based fault tolerance (ABFT) techniques, which relate real number parity values with data flows and operations, are used to protect the data processing operations. The additional checking features utilize resources that can be substituted for normal processing elements when resource reconfiguration is required to replace a failed unit

Methods to improve the reliability and resiliency of near/sub-threshold digital circuits

Energy consumption is one of the primary bottlenecks to both large and small scale modern compute platforms. Reducing the operating voltage of digital circuits to voltages where the supply voltage is near or below the threshold of the transistors has recently gained attention as a method to reduce the energy required for computations by as much as 6 times. However, when operating at near/sub-threshold voltages (where the supply voltage is near or below the threshold of the transistors), imperfections in transistor manufacturing, changes in temperature, and other difficult-to-predict factors cause wide variations in the timing of Complementary Metal-Oxide Semiconductor (CMOS) circuits due to an increased sensitivity at lower voltages. These increased variations result in poor aggregate performance and cause increased rates of error occurrence in computation. This work introduces several new methods to improve the reliability of near/sub-threshold circuits. The first is a design automation technique that is used to aid in low-voltage digital standard cell synthesis. Second, two circuit-level techniques are also introduced that aim to improve the reliability and resiliency of digital circuits by means of completion/error detection. These techniques are shown to improve speed and lower energy consumption at low overheads compared to previous methods. Most importantly, these circuit-level methods are specifically designed to operate at low voltages and can themselves tolerate variations and operation in harsh environments. Finally, a test-chip prototype designed in 65nm-CMOS demonstrates the practicality and feasibility of a proposed current sensing error detector