Variable - temperature scanning optical and force microscope

The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional helium flow cryostats. In AFM mode, the distance between the sample and an etched tungsten tip is controlled by a self - sensing piezoelectric tuning fork. The vertical position of both the AFM head and microscope objective can be accurately controlled using piezoelectric coarse approach motors. The scanning is performed using a compact XYZ stage, while the AFM and optical head are kept fixed, allowing scanning probe and optical measurements to be acquired simultaneously and in concert. The free optical axis of the microscope enables both reflection and transmission experiments to be performed.Comment: 24 pages, 9 figures, submitted to the journal "Review of Scientific Instruments

Polymerized LB films imaged with a combined atomic force microscope-fluorescence microscope

The first results obtained with a new stand-alone atomic force microscope (AFM) integrated with a standard Zeiss optical fluorescence microscope are presented. The optical microscope allows location and selection of objects to be imaged with the high-resolution AFM. Furthermore, the combined microscope enables a direct comparison between features observed in the fluorescence microscope and those observed in the images obtained with the AFM, in air or under liquid. The cracks in polymerized Langmuir-Blodgett films of lO,l2-pentacosadiynoic acid as observed in the fluorescence microscope run parallel to one of the lattice directions of the crystal as revealed by molecular resolution images obtained with the AFM. The orientation of these cracks also coincides with the polarization direction of the fluorescent light, indicating that the cracks run along the polymer backbone. Ripple-like corrugations on a submicrometer scale have been observed, which may be due to mechanical stress created during the polymerization process

Far-field mapping of the longitudinal magnetic and electric optical fields

In this letter, we demonstrate the experimental mapping of the longitudinal magnetic and electric optical fields with a standard scanning microscope that involves a high numerical aperture far-field objective. The imaging concept relies upon the insertion of an azimuthal or a radial polarizer within the detection path of the microscope which acts as an optical electromagnetic filter aimed at transmitting selectively to the detector the signal from the magnetic or electric longitudinal fields present in the detection volume, respectively. The resulting system is thus versatile, non invasive, of high resolution, and shows high detection efficiencies. Magnetic optical properties of physical and biological micro and nano-structures may thus be revealed with a far-field microscope

Water window imaging x ray microscope

A high resolution x ray microscope for imaging microscopic structures within biological specimens has an optical system including a highly polished primary and secondary mirror coated with identical multilayer coatings, the mirrors acting at normal incidence. The coatings have a high reflectivity in the narrow wave bandpass between 23.3 and 43.7 angstroms and have low reflectivity outside of this range. The primary mirror has a spherical concave surface and the secondary mirror has a spherical convex surface. The radii of the mirrors are concentric about a common center of curvature on the optical axis of the microscope extending from the object focal plane to the image focal plane. The primary mirror has an annular configuration with a central aperture and the secondary mirror is positioned between the primary mirror and the center of curvature for reflecting radiation through the aperture to a detector. An x ray filter is mounted at the stage end of the microscope, and film sensitive to x rays in the desired band width is mounted in a camera at the image plane of the optical system. The microscope is mounted within a vacuum chamber for minimizing the absorption of x rays in air from a source through the microscope

Plasmonic interferometry: probing launching dipoles in scanning-probe plasmonics

We develop a semi-analytical method for analyzing surface plasmon interferometry using near-field scanning optical sources. We compare our approach to Young double hole interferometry experiments using scanning tunneling microscope (STM) discussed in the literature and realize experiments with an aperture near-field scanning optical microscope (NSOM) source positioned near a ring like aperture slit milled in a thick gold film. In both cases the agreement between experiments and model is very good. We emphasize the role of dipole orientations and discuss the role of magnetic versus electric dipole contributions to the imaging process as well as the directionality of the effective dipoles associated with the various optical and plasmonic sources.Comment: To appear in Journal of Applied Physics (2014

Nanoscale coherent imaging of photonic structures by PSTM

We present an alternative instrument to map local optical field distributions: a photon scanning tunneling microscope (PSTM). In a PSTM a near-field optical fiber probe is used to frustrate the evanescent field above an integrated optical device. The evanescent wave is converted into a propagating wave that is coupled into the fiber, guided through it and subsequently detected by a photomultiplier tub

Optical Mineralogy

This resource is a 43 page pdf document on the principals of optical mineralogy. Topics include light, the polarizing light microscope, the refractive index, optical classes and indicatrix theory, the relationship of optical properties to crystal chemistry, and advanced methods in optical mineralogy. The website features both text and figures. Educational levels: Graduate or professional, Undergraduate lower division, Undergraduate upper division

How to erase surface plasmon fringes

We report the realization of a dual surface plasmon polariton (SPP) microscope based on leakage radiation (LR) analysis. The microscope can either image SPP propagation in the direct space or tin the Fourier space. This particularity allows in turn manipulation of the LR image for a clear separation of different interfering SPP contributions present close to optical nanoelements.Comment: Appl. Phys. Lett. 89, 091117 (2006