Ontology Analysis Based on Ontology Design Patterns

The so-called Ontology Design Patterns (ODPs), which have been defined as solutions to ontological design problems, are of great help to developers when modelling ontologies since these patterns provide a development guide and improve the quality of the resulting ontologies. However, it has been demonstrated that, in many cases, developers encounter difficulties when they have to reuse ontology design patterns and include errors in the modelling. Thus, to avoid errors in ontology modelling, this paper proposes classifying errors into two types: (1) errors related to existing ODPs, called anti-patterns, and (2) errors not related to existing ODPs, called worst practices. This classification is the result of analysing a set of ontologies which come from an academic experiment. In addition, the paper presents a general classification of the worst practices found and a set of worst practice examples. Finally, the paper shows an example of how the aforementioned worst practices could be related among them

A Double Classification of Common Pitfalls in Ontologies

The application of methodologies for building ontologies has improved the ontology quality. However, such a quality is not totally guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or worst practices in the modelling. In this context, our aim in this paper is twofold: (1) to provide a catalogue of common worst practices, which we call pitfalls, and (2) to present a double classification of such pitfalls. These two products will serve in the ontology development in two ways: (a) to avoid the appearance of pitfalls in the ontology modelling, and (b) to evaluate and correct ontologies to improve their quality