Correcting Charge-Constrained Errors in the Rank-Modulation Scheme

We investigate error-correcting codes for a the rank-modulation scheme with an application to flash memory devices. In this scheme, a set of n cells stores information in the permutation induced by the different charge levels of the individual cells. The resulting scheme eliminates the need for discrete cell levels, overcomes overshoot errors when programming cells (a serious problem that reduces the writing speed), and mitigates the problem of asymmetric errors. In this paper, we study the properties of error-correcting codes for charge-constrained errors in the rank-modulation scheme. In this error model the number of errors corresponds to the minimal number of adjacent transpositions required to change a given stored permutation to another erroneous one—a distance measure known as Kendall’s τ-distance.We show bounds on the size of such codes, and use metric-embedding techniques to give constructions which translate a wealth of knowledge of codes in the Lee metric to codes over permutations in Kendall’s τ-metric. Specifically, the one-error-correcting codes we construct are at least half the ball-packing upper bound

Systematic Error-Correcting Codes for Rank Modulation

The rank-modulation scheme has been recently proposed for efficiently storing data in nonvolatile memories. Error-correcting codes are essential for rank modulation, however, existing results have been limited. In this work we explore a new approach, \emph{systematic error-correcting codes for rank modulation}. Systematic codes have the benefits of enabling efficient information retrieval and potentially supporting more efficient encoding and decoding procedures. We study systematic codes for rank modulation under Kendall's $\tau$-metric as well as under the $\ell_\infty$-metric. In Kendall's $\tau$-metric we present $[k+2,k,3]$-systematic codes for correcting one error, which have optimal rates, unless systematic perfect codes exist. We also study the design of multi-error-correcting codes, and provide two explicit constructions, one resulting in $[n+1,k+1,2t+2]$ systematic codes with redundancy at most $2t+1$. We use non-constructive arguments to show the existence of $[n,k,n-k]$-systematic codes for general parameters. Furthermore, we prove that for rank modulation, systematic codes achieve the same capacity as general error-correcting codes. Finally, in the $\ell_\infty$-metric we construct two $[n,k,d]$ systematic multi-error-correcting codes, the first for the case of $d=O(1)$, and the second for $d=\Theta(n)$. In the latter case, the codes have the same asymptotic rate as the best codes currently known in this metric

New Bounds for Permutation Codes in Ulam Metric

New bounds on the cardinality of permutation codes equipped with the Ulam distance are presented. First, an integer-programming upper bound is derived, which improves on the Singleton-type upper bound in the literature for some lengths. Second, several probabilistic lower bounds are developed, which improve on the known lower bounds for large minimum distances. The results of a computer search for permutation codes are also presented.Comment: To be presented at ISIT 2015, 5 page

Error-Correction in Flash Memories via Codes in the Ulam Metric

We consider rank modulation codes for flash memories that allow for handling arbitrary charge-drop errors. Unlike classical rank modulation codes used for correcting errors that manifest themselves as swaps of two adjacently ranked elements, the proposed \emph{translocation rank codes} account for more general forms of errors that arise in storage systems. Translocations represent a natural extension of the notion of adjacent transpositions and as such may be analyzed using related concepts in combinatorics and rank modulation coding. Our results include derivation of the asymptotic capacity of translocation rank codes, construction techniques for asymptotically good codes, as well as simple decoding methods for one class of constructed codes. As part of our exposition, we also highlight the close connections between the new code family and permutations with short common subsequences, deletion and insertion error-correcting codes for permutations, and permutation codes in the Hamming distance

Generalized Gray Codes for Local Rank Modulation

We consider the local rank-modulation scheme in which a sliding window going over a sequence of real-valued variables induces a sequence of permutations. Local rank-modulation is a generalization of the rank-modulation scheme, which has been recently suggested as a way of storing information in flash memory. We study Gray codes for the local rank-modulation scheme in order to simulate conventional multi-level flash cells while retaining the benefits of rank modulation. Unlike the limited scope of previous works, we consider code constructions for the entire range of parameters including the code length, sliding window size, and overlap between adjacent windows. We show our constructed codes have asymptotically-optimal rate. We also provide efficient encoding, decoding, and next-state algorithms.Comment: 7 pages, 1 figure, shorter version was submitted to ISIT 201

Compressed Encoding for Rank Modulation

Rank modulation has been recently proposed as a scheme for storing information in flash memories. While rank modulation has advantages in improving write speed and endurance, the current encoding approach is based on the "push to the top" operation that is not efficient in the general case. We propose a new encoding procedure where a cell level is raised to be higher than the minimal necessary subset -instead of all - of the other cell levels. This new procedure leads to a significantly more compressed (lower charge levels) encoding. We derive an upper bound for a family of codes that utilize the proposed encoding procedure, and consider code constructions that achieve that bound for several special cases