Test Pattern Generation Using LFSR with Reseeding Scheme for BIST Designs

ABSTRACT: In this paper we present LFSR reseeding scheme for BIST. A time -to -market efficient algorithm is introduced for selecting reseeding points in the test sequence. This algorithm targets complete fault coverage and minimization of the test length. Functional broadside tests that avoid over testing by ensuring that a circuit traverses only reachable states during the functional clock cycles of a tes