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1 research outputs found
Function risk assessment under memory leakage
Author
FU Jianming
GUO Zhengwei
+3Â more
JIANG Baihe
JIN Rui
LIN Yan
Publication venue
'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
01/10/2018
Field of study
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Crossref
Institutional Knowledge at Singapore Management University
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