Deep Extreme Multi-label Learning

Extreme multi-label learning (XML) or classification has been a practical and important problem since the boom of big data. The main challenge lies in the exponential label space which involves $2^L$ possible label sets especially when the label dimension $L$ is huge, e.g., in millions for Wikipedia labels. This paper is motivated to better explore the label space by originally establishing an explicit label graph. In the meanwhile, deep learning has been widely studied and used in various classification problems including multi-label classification, however it has not been properly introduced to XML, where the label space can be as large as in millions. In this paper, we propose a practical deep embedding method for extreme multi-label classification, which harvests the ideas of non-linear embedding and graph priors-based label space modeling simultaneously. Extensive experiments on public datasets for XML show that our method performs competitive against state-of-the-art result

Nearest Labelset Using Double Distances for Multi-label Classification

Multi-label classification is a type of supervised learning where an instance may belong to multiple labels simultaneously. Predicting each label independently has been criticized for not exploiting any correlation between labels. In this paper we propose a novel approach, Nearest Labelset using Double Distances (NLDD), that predicts the labelset observed in the training data that minimizes a weighted sum of the distances in both the feature space and the label space to the new instance. The weights specify the relative tradeoff between the two distances. The weights are estimated from a binomial regression of the number of misclassified labels as a function of the two distances. Model parameters are estimated by maximum likelihood. NLDD only considers labelsets observed in the training data, thus implicitly taking into account label dependencies. Experiments on benchmark multi-label data sets show that the proposed method on average outperforms other well-known approaches in terms of Hamming loss, 0/1 loss, and multi-label accuracy and ranks second after ECC on the F-measure