We introduce a projection based multi-channel restoration method which is useful in cases for which there is no a priori information about the input signal. The method is especially helpful in situations where a large number of specimens are later combined to achieve additional noise reduction. We describe the approach and discuss the problem of restoring electron micrographs. The method does require knowledge of the impulse response of the degradation. For this reason, the sensitivity of the approach to uncertainty in this degradation is investigated through simulation. 1