Rewriting Codes for Joint Information Storage in Flash Memories

Memories whose storage cells transit irreversibly between states have been common since the start of the data storage technology. In recent years, flash memories have become a very important family of such memories. A flash memory cell has q states—state 0.1.....q-1 - and can only transit from a lower state to a higher state before the expensive erasure operation takes place. We study rewriting codes that enable the data stored in a group of cells to be rewritten by only shifting the cells to higher states. Since the considered state transitions are irreversible, the number of rewrites is bounded. Our objective is to maximize the number of times the data can be rewritten. We focus on the joint storage of data in flash memories, and study two rewriting codes for two different scenarios. The first code, called floating code, is for the joint storage of multiple variables, where every rewrite changes one variable. The second code, called buffer code, is for remembering the most recent data in a data stream. Many of the codes presented here are either optimal or asymptotically optimal. We also present bounds to the performance of general codes. The results show that rewriting codes can integrate a flash memory’s rewriting capabilities for different variables to a high degree

Rewriting Flash Memories by Message Passing

This paper constructs WOM codes that combine rewriting and error correction for mitigating the reliability and the endurance problems in flash memory. We consider a rewriting model that is of practical interest to flash applications where only the second write uses WOM codes. Our WOM code construction is based on binary erasure quantization with LDGM codes, where the rewriting uses message passing and has potential to share the efficient hardware implementations with LDPC codes in practice. We show that the coding scheme achieves the capacity of the rewriting model. Extensive simulations show that the rewriting performance of our scheme compares favorably with that of polar WOM code in the rate region where high rewriting success probability is desired. We further augment our coding schemes with error correction capability. By drawing a connection to the conjugate code pairs studied in the context of quantum error correction, we develop a general framework for constructing error-correction WOM codes. Under this framework, we give an explicit construction of WOM codes whose codewords are contained in BCH codes.Comment: Submitted to ISIT 201

Time-Space Constrained Codes for Phase-Change Memories

Phase-change memory (PCM) is a promising non-volatile solid-state memory technology. A PCM cell stores data by using its amorphous and crystalline states. The cell changes between these two states using high temperature. However, since the cells are sensitive to high temperature, it is important, when programming cells, to balance the heat both in time and space. In this paper, we study the time-space constraint for PCM, which was originally proposed by Jiang et al. A code is called an \emph{$(\alpha,\beta,p)$-constrained code} if for any $\alpha$ consecutive rewrites and for any segment of $\beta$ contiguous cells, the total rewrite cost of the $\beta$ cells over those $\alpha$ rewrites is at most $p$. Here, the cells are binary and the rewrite cost is defined to be the Hamming distance between the current and next memory states. First, we show a general upper bound on the achievable rate of these codes which extends the results of Jiang et al. Then, we generalize their construction for $(\alpha\geq 1, \beta=1,p=1)$-constrained codes and show another construction for $(\alpha = 1, \beta\geq 1,p\geq1)$-constrained codes. Finally, we show that these two constructions can be used to construct codes for all values of $\alpha$, $\beta$, and $p$

When Do WOM Codes Improve the Erasure Factor in Flash Memories?

Flash memory is a write-once medium in which reprogramming cells requires first erasing the block that contains them. The lifetime of the flash is a function of the number of block erasures and can be as small as several thousands. To reduce the number of block erasures, pages, which are the smallest write unit, are rewritten out-of-place in the memory. A Write-once memory (WOM) code is a coding scheme which enables to write multiple times to the block before an erasure. However, these codes come with significant rate loss. For example, the rate for writing twice (with the same rate) is at most 0.77. In this paper, we study WOM codes and their tradeoff between rate loss and reduction in the number of block erasures, when pages are written uniformly at random. First, we introduce a new measure, called erasure factor, that reflects both the number of block erasures and the amount of data that can be written on each block. A key point in our analysis is that this tradeoff depends upon the specific implementation of WOM codes in the memory. We consider two systems that use WOM codes; a conventional scheme that was commonly used, and a new recent design that preserves the overall storage capacity. While the first system can improve the erasure factor only when the storage rate is at most 0.6442, we show that the second scheme always improves this figure of merit.Comment: to be presented at ISIT 201