ABSTRACT LFSR-Based BIST for Analog Circuits Using Slope Detection

This paper presents a new analog BIST scheme using a slope detection technique. In test mode, a circuit under test (CUT) is stimulated with a periodic rectangular pulse generated from a Linear Feed-Back Shift Register (LFSR) and a periodic invariant response is generated. The width of the pulse is a BIST parameter to allow a trade-off between test time and fault coverage. In order to maximize fault coverage and minimize the hardware overhead, we propose a slope detection technique which analyzes the response of CUT using a counter and a simple digital gate. Simulation results are presented to show the feasibility of this scheme