SIRU development. Volume 1: System development

A complete description of the development and initial evaluation of the Strapdown Inertial Reference Unit (SIRU) system is reported. System development documents the system mechanization with the analytic formulation for fault detection and isolation processing structure; the hardware redundancy design and the individual modularity features; the computational structure and facilities; and the initial subsystem evaluation results

Conceptual design and feasibility evaluation model of a 10 to the 8th power bit oligatomic mass memory. Volume 1: Conceptual design

The oligatomic (mirror) thin film memory technology is a suitable candidate for general purpose spaceborne applications in the post-1975 time frame. Capacities of around 10 to the 8th power bits can be reliably implemented with systems designed around a 335 million bit module. The recommended mode was determined following an investigation of implementation sizes ranging from an 8,000,000 to 100,000,000 bits per module. Cost, power, weight, volume, reliability, maintainability and speed were investigated. The memory includes random access, NDRO, SEC-DED, nonvolatility, and dual interface characteristics. The applications most suitable for the technology are those involving a large capacity with high speed (no latency), nonvolatility, and random accessing

Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations

Fault-tolerant hardware designs and their reliability analysis

This thesis was submitted for the degree of Doctor of Philosophy and awarded by Brunel University.Fault-tolerance, which is a complement to fault prevention, is an effective method of achieving ultra-high reliability. By taking this approach fault free computation can be achieved despite the presence of fault in the system. In this thesis three new fault tolerant techniques are presented and their advantages over well known fault-tolerant strategies are shown. One of these new techniques achieves higher reliability than any other similar techniques presented in the literature. Generally fault-tolerant structures consist of four major blocks: the replicated modules, the disagreement and detection circuit, the switching circuit, and the voting mechanism. The most critical component in a fault-tolerant system is the voter because the final output of the system is computed by this component. This dissertation presents a new implementation for voters which reduces both the complexity and the occupied area on the chip. The structures of the three techniques developed in this work are such that the complexity of their switching mechanisms grows only linearly with the number of modules but the voting mechanism complexity increases significantly. This is a better approach than those schemes in which the switching complexity increases significantly and the voter's complexity remains constant or grows linearly with the number of modules because it is easier to implement a complex voter than a complex switch (voters have more regular structures). Extensive comparisons are made between different fault-tolerant techniques. A new reliability model is also developed for system reliability evaluation of the new designs. The results of these analyses are plotted, and the advantages of the new techniques are demonstrated. In the final part of the work an expert system is described which uses the knowledge acquired by these comparisons. This expert system is meant as a prototype of a component of a CAD tool which will act as an advisor on fault-tolerant techniques

Real Time Fault Detection and Diagnostics Using FPGA-Based Architecture

Errors within circuits caused by radiation continue to be an important concern to developers. A new methodology of real time fault detection and diagnostics utilizing FPGA based architectures while under radiation were investigated in this research. The contributions of this research are focused on three areas; a full test platform to evaluate a circuit while under irradiation, an algorithm to detect and diagnose fault locations within a circuit, and finally to characterize Triple Design Triple Modular Redundancy (TDTMR), a new form of TMR. Five different test setups, injected fault test, gamma radiation test, thermal radiation test, optical laser test, and optical flash test, were used to assess the effectiveness of these three research goals. The testing platform was constructed with two FPGA boards, the Device Under Test (DUT) and the controller board, to generate and evaluate specific vector sets sent to the DUT. The testing platform combines a myriad of testing and measuring equipment and work hours onto one small reprogrammable and reusable FPGA. This device was able to be used in multiple test setups. The controlling logic can be interchanged to test multiple circuit designs under various forms of radiation. The detection and diagnostic algorithm was designed to determine fault locations in real time. The algorithm used for diagnosing the fault location uses inverse deductive elimination. By using test generation tools, fault lists were developed. The fault lists were used to narrow \ the possible fault locations within the circuit. The algorithm is able to detect single stuck at faults based on these lists. The algorithm can also detect multiple output errors but not able to diagnose multiple stuck at faults in real time

Application of advanced technology to space automation

Automated operations in space provide the key to optimized mission design and data acquisition at minimum cost for the future. The results of this study strongly accentuate this statement and should provide further incentive for immediate development of specific automtion technology as defined herein. Essential automation technology requirements were identified for future programs. The study was undertaken to address the future role of automation in the space program, the potential benefits to be derived, and the technology efforts that should be directed toward obtaining these benefits

Study of fault-tolerant software technology

Presented is an overview of the current state of the art of fault-tolerant software and an analysis of quantitative techniques and models developed to assess its impact. It examines research efforts as well as experience gained from commercial application of these techniques. The paper also addresses the computer architecture and design implications on hardware, operating systems and programming languages (including Ada) of using fault-tolerant software in real-time aerospace applications. It concludes that fault-tolerant software has progressed beyond the pure research state. The paper also finds that, although not perfectly matched, newer architectural and language capabilities provide many of the notations and functions needed to effectively and efficiently implement software fault-tolerance

Evaluation of Fault Mitigation Techniques Based on Approximate Computing Under Radiation

A software technique based on approximate computing and redundancy is presented to mitigate radiation-induced soft errors in COTS microprocessors. Approximate Computing relies on the capability of certain applications to accept imprecise results to improve efficiency by sacrificing its results in a controlled manner. Our approach avoids the time overhead derived from hardening while preserving the detection and correction rate. Experimental results show that we can detect and correct SDC events improving the cross-section up to 160×, and keeping accuracy under control without compromising performance. In addition, an accuracy-aware layer is included to improve error mitigation and to provide a trade-off between the number of tolerable errors and the necessary accuracy.MultiRad (funded by Région Auvergne-Rhône-Alpes, France); IRT Nanoelec (French National Research Agency ANR-10-AIRT-05 project funded through the Program d’investissement d’avenir); UGA/LPSC/-GENESIS platform and PID2022-138696OB-C22 (funded by the Spanish Ministry of Science and Innovation)

Novel fault tolerant Multi-Bit Upset (MBU) Error-Detection and Correction (EDAC) architecture

Desde el punto de vista de seguridad, la certificación aeronáutica de aplicaciones críticas de vuelo requiere diferentes técnicas que son usadas para prevenir fallos en los equipos electrónicos. Los fallos de tipo hardware debido a la radiación solar que existe a las alturas standard de vuelo, como SEU (Single Event Upset) y MCU (Multiple Bit Upset), provocan un cambio de estado de los bits que soportan la información almacenada en memoria. Estos fallos se producen, por ejemplo, en la memoria de configuración de una FPGA, que es donde se definen todas las funcionalidades. Las técnicas de protección requieren normalmente de redundancias que incrementan el coste, número de componentes, tamaño de la memoria y peso. En la fase de desarrollo de aplicaciones críticas de vuelo, generalmente se utilizan una serie de estándares o recomendaciones de diseño como ABD100, RTCA DO-160, IEC62395, etc, y diferentes técnicas de protección para evitar fallos del tipo SEU o MCU. Estas técnicas están basadas en procesos tecnológicos específicos como memorias robustas, codificaciones para detección y corrección de errores (EDAC), redundancias software, redundancia modular triple (TMR) o soluciones a nivel sistema. Esta tesis está enfocada a minimizar e incluso suprimir los efectos de los SEUs y MCUs que particularmente ocurren en la electrónica de avión como consecuencia de la exposición a radiación de partículas no cargadas (como son los neutrones) que se encuentra potenciada a las típicas alturas de vuelo. La criticidad en vuelo que tienen determinados sistemas obligan a que dichos sistemas sean tolerantes a fallos, es decir, que garanticen un correcto funcionamiento aún cuando se produzca un fallo en ellos. Es por ello que soluciones como las presentadas en esta tesis tienen interés en el sector industrial. La Tesis incluye una descripción inicial de la física de la radiación incidente sobre aeronaves, y el análisis de sus efectos en los componentes electrónicos aeronaúticos basados en semiconductor, que desembocan en la generación de SEUs y MCUs. Este análisis permite dimensionar adecuadamente y optimizar los procedimientos de corrección que se propongan posteriormente. La Tesis propone un sistema de corrección de fallos SEUs y MCUs que permita cumplir la condición de Sistema Tolerante a Fallos, a la vez que minimiza los niveles de redundancia y de complejidad de los códigos de corrección. El nivel de redundancia es minimizado con la introducción del concepto propuesto HSB (Hardwired Seed Bits), en la que se reduce la información esencial a unos pocos bits semilla, neutros frente a radiación. Los códigos de corrección requeridos se reducen a la corrección de un único error, gracias al uso del concepto de Distancia Virtual entre Bits, a partir del cual será posible corregir múltiples errores simultáneos (MCUs) a partir de códigos simples de corrección. Un ejemplo de aplicación de la Tesis es la implementación de una Protección Tolerante a Fallos sobre la memoria SRAM de una FPGA. Esto significa que queda protegida no sólo la información contenida en la memoria sino que también queda auto-protegida la función de protección misma almacenada en la propia SRAM. De esta forma, el sistema es capaz de auto-regenerarse ante un SEU o incluso un MCU, independientemente de la zona de la SRAM sobre la que impacte la radiación. Adicionalmente, esto se consigue con códigos simples tales como corrección por bit de paridad y Hamming, minimizando la dedicación de recursos de computación hacia tareas de supervisión del sistema.For airborne safety critical applications certification, different techniques are implemented to prevent failures in electronic equipments. The HW failures at flying heights of aircrafts related to solar radiation such as SEU (Single-Event-Upset) and MCU (Multiple Bit Upset), causes bits alterations that corrupt the information at memories. These HW failures cause errors, for example, in the Configuration-Code of an FPGA that defines the functionalities. The protection techniques require classically redundant functionalities that increases the cost, components, memory space and weight. During the development phase for airborne safety critical applications, different aerospace standards are generally recommended as ABD100, RTCA-DO160, IEC62395, etc, and different techniques are classically used to avoid failures such as SEU or MCU. These techniques are based on specific technology processes, Hardened memories, error detection and correction codes (EDAC), SW redundancy, Triple Modular Redundancy (TMR) or System level solutions. This Thesis is focussed to minimize, and even to remove, the effects of SEUs and MCUs, that particularly occurs in the airborne electronics as a consequence of its exposition to solar radiation of non-charged particles (for example the neutrons). These non-charged particles are even powered at flying altitudes due to aircraft volume. The safety categorization of different equipments/functionalities requires a design based on fault-tolerant approach that means, the system will continue its normal operation even if a failure occurs. The solution proposed in this Thesis is relevant for the industrial sector because of its Fault-tolerant capability. Thesis includes an initial description for the physics of the solar radiation that affects into aircrafts, and also the analyses of their effects into the airborne electronics based on semiconductor components that create the SEUs and MCUs. This detailed analysis allows the correct sizing and also the optimization of the procedures used to correct the errors. This Thesis proposes a system that corrects the SEUs and MCUs allowing the fulfilment of the Fault-Tolerant requirement, reducing the redundancy resources and also the complexity of the correction codes. The redundancy resources are minimized thanks to the introduction of the concept of HSB (Hardwired Seed Bits), in which the essential information is reduced to a few seed bits, neutral to radiation. The correction codes required are reduced to the correction of one error thanks to the use of the concept of interleaving distance between adjacent bits, this allows the simultaneous multiple error correction with simple single error correcting codes. An example of the application of this Thesis is the implementation of the Fault-tolerant architecture of an SRAM-based FPGA. That means that the information saved in the memory is protected but also the correction functionality is auto protected as well, also saved into SRAM memory. In this way, the system is able to self-regenerate the information lost in case of SEUs or MCUs. This is independent of the SRAM area affected by the radiation. Furthermore, this performance is achieved by means simple error correcting codes, as parity bits or Hamming, that minimize the use of computational resources to this supervision tasks for system.Programa Oficial de Doctorado en Ingeniería Eléctrica, Electrónica y AutomáticaPresidente: Luis Alfonso Entrena Arrontes.- Secretario: Pedro Reviriego Vasallo.- Vocal: Mª Luisa López Vallej