Is Robust Design-for-Security Robust Enough? Attack on Locked Circuits with Restricted Scan Chain Access

The security of logic locking has been called into question by various attacks, especially a Boolean satisfiability (SAT) based attack, that exploits scan access in a working chip. Among other techniques, a robust design-for-security (DFS) architecture was presented to restrict any unauthorized scan access, thereby, thwarting the SAT attack (or any other attack that relies on scan access). Nevertheless, in this work, we successfully break this technique by recovering the secret key despite the lack of scan access. Our security analysis on a few benchmark circuits protected by the robust DFS architecture demonstrates the effectiveness of our attack; on average ~95% of the key bits are correctly recovered, and almost 100% in most cases. To overcome this and other prevailing attacks, we propose a defense by making fundamental changes to the robust DFS technique; the new defense can withstand all logic locking attacks. We observe, on average, lower area overhead (~1.65%) than the robust DFS design (~5.15%), and similar test coverage (~99.88%).Comment: To be published in IEEE/ACM International Conference on Computer-Aided Design (ICCAD) 201

DynUnlock: Unlocking Scan Chains Obfuscated using Dynamic Keys

Outsourcing in semiconductor industry opened up venues for faster and cost-effective chip manufacturing. However, this also introduced untrusted entities with malicious intent, to steal intellectual property (IP), overproduce the circuits, insert hardware Trojans, or counterfeit the chips. Recently, a defense is proposed to obfuscate the scan access based on a dynamic key that is initially generated from a secret key but changes in every clock cycle. This defense can be considered as the most rigorous defense among all the scan locking techniques. In this paper, we propose an attack that remodels this defense into one that can be broken by the SAT attack, while we also note that our attack can be adjusted to break other less rigorous (key that is updated less frequently) scan locking techniques as well.Comment: Accepted at Design, Automation and Test in Europe Conference (DATE) 202

On Designing Secure and Robust Scan Chain for Protecting Obfuscated Logic

In this paper, we assess the security and testability of the state-of-the-art design-for-security (DFS) architectures in the presence of scan-chain locking/obfuscation, a group of solution that has previously proposed to restrict unauthorized access to the scan chain. We discuss the key leakage vulnerability in the recently published prior-art DFS architectures. This leakage relies on the potential glitches in the DFS architecture that could lead the adversary to make a leakage condition in the circuit. Also, we demonstrate that the state-of-the-art DFS architectures impose some substantial architectural drawbacks that moderately affect both test flow and design constraints. We propose a new DFS architecture for building a secure scan chain architecture while addressing the potential of key leakage. The proposed architecture allows the designer to perform the structural test with no limitation, enabling an untrusted foundry to utilize the scan chain for manufacturing fault testing without needing to access the scan chain. Our proposed solution poses negligible limitation/overhead on the test flow, as well as the design criteria

SeqL: Secure Scan-Locking for IP Protection

Existing logic-locking attacks are known to successfully decrypt functionally correct key of a locked combinational circuit. It is possible to extend these attacks to real-world Silicon-based Intellectual Properties (IPs, which are sequential circuits) through scan-chains by selectively initializing the combinational logic and analyzing the responses. In this paper, we propose SeqL, which achieves functional isolation and locks selective flip-flop functional-input/scan-output pairs, thus rendering the decrypted key functionally incorrect. We conduct a formal study of the scan-locking problem and demonstrate automating our proposed defense on any given IP. We show that SeqL hides functionally correct keys from the attacker, thereby increasing the likelihood of the decrypted key being functionally incorrect. When tested on pipelined combinational benchmarks (ISCAS,MCNC), sequential benchmarks (ITC) and a fully-fledged RISC-V CPU, SeqL gave 100% resilience to a broad range of state-of-the-art attacks including SAT[1], Double-DIP[2], HackTest[3], SMT[4], FALL[5], Shift-and-Leak[6] and Multi-cycle attacks[7]

DFSSD: Deep Faults and Shallow State Duality, A Provably Strong Obfuscation Solution for Circuits with Restricted Access to Scan Chain

In this paper, we introduce DFSSD, a novel logic locking solution for sequential and FSM circuits with a restricted (locked) access to the scan chain. DFSSD combines two techniques for obfuscation: (1) Deep Faults, and (2) Shallow State Duality. Both techniques are specifically designed to resist against sequential SAT attacks based on bounded model checking. The shallow state duality prevents a sequential SAT attack from taking a shortcut for early termination without running an exhaustive unbounded model checker to assess if the attack could be terminated. The deep fault, on the other hand, provides a designer with a technique for building deep, yet key recoverable faults that could not be discovered by sequential SAT (and bounded model checker based) attacks in a reasonable time

NNgSAT: Neural Network guided SAT Attack on Logic Locked Complex Structures

The globalization of the IC supply chain has raised many security threats, especially when untrusted parties are involved. This has created a demand for a dependable logic obfuscation solution to combat these threats. Amongst a wide range of threats and countermeasures on logic obfuscation in the 2010s decade, the Boolean satisfiability (SAT) attack, or one of its derivatives, could break almost all state-of-the-art logic obfuscation countermeasures. However, in some cases, particularly when the logic locked circuits contain complex structures, such as big multipliers, large routing networks, or big tree structures, the logic locked circuit is hard-to-be-solved for the SAT attack. Usage of these structures for obfuscation may lead a strong defense, as many SAT solvers fail to handle such complexity. However, in this paper, we propose a neural-network-guided SAT attack (NNgSAT), in which we examine the capability and effectiveness of a message-passing neural network (MPNN) for solving these complex structures (SAT-hard instances). In NNgSAT, after being trained as a classifier to predict SAT/UNSAT on a SAT problem (NN serves as a SAT solver), the neural network is used to guide/help the actual SAT solver for finding the SAT assignment(s). By training NN on conjunctive normal forms (CNFs) corresponded to a dataset of logic locked circuits, as well as fine-tuning the confidence rate of the NN prediction, our experiments show that NNgSAT could solve 93.5% of the logic locked circuits containing complex structures within a reasonable time, while the existing SAT attack cannot proceed the attack flow in them