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Single-shot pop-out 3D metrology of thin specimens with TEM
Three-dimensional (3D) imaging of thin, extended specimens at nanometer
resolution is critical for applications in biology, materials science, advanced
synthesis, and manufacturing. Many 3D imaging techniques are limited to surface
features, or available only for selective cross-sections, or require a tilt
series of a local region, hence making them unsuitable for rapid,
non-sacrificial screening of extended objects, or investigating fast dynamics.
Here we describe a coherent imaging technique that recovers the 3D volume of a
thin specimen with only a single, non-tomographic, energy-filtered,
bright-field transmission electron microscopy (TEM) image. This technique does
not require physically fracturing or sectioning thin specimens, only needs a
single brief exposures to electron doses of ~100 e {\AA}-2, and can be readily
calibrated for many existing TEMs; thus it can be widely deployed for rapid 3D
metrology that complements existing forms of metrology.Comment: 33 pages, 14 figure