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2 research outputs found
Hot Hole-Induced Device Degradation By Drain Junction Reverse Current
Author
Publication venue
'The Electrochemical Society'
Publication date
01/01/2013
Field of study
No full text
Crossref
Hot hole-induced device degradation by drain junction reverse current
Author
Publication venue
'Elsevier BV'
Publication date
Field of study
No full text
Crossref
No full text
No full text
