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    2 research outputs found

    High-cycle fatigue of micromachined single crystal silicon measured using a parallel fatigue test system

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    'Institute of Electronics, Information and Communications Engineers (IEICE)'
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    Kyoto University Research Information Repository

    High-cycle fatigue of micromachined single crystal silicon measured using a parallel fatigue test system

    Author
      Publication venue
      'Institute of Electronics, Information and Communications Engineers (IEICE)'
      Publication date
      Field of study
      No full text
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