On testing VLSI chips for the big Viterbi decoder

A general technique that can be used in testing very large scale integrated (VLSI) chips for the Big Viterbi Decoder (BVD) system is described. The test technique is divided into functional testing and fault-coverage testing. The purpose of functional testing is to verify that the design works functionally. Functional test vectors are converted from outputs of software simulations which simulate the BVD functionally. Fault-coverage testing is used to detect and, in some cases, to locate faulty components caused by bad fabrication. This type of testing is useful in screening out bad chips. Finally, design for testability, which is included in the BVD VLSI chip design, is described in considerable detail. Both the observability and controllability of a VLSI chip are greatly enhanced by including the design for the testability feature

A Low-Cost FPGA-Based Test and Diagnosis Architecture for SRAMs

The continues improvement of manufacturing technologies allows the realization of integrated circuits containing an ever increasing number of transistors. A major part of these devices is devoted to realize SRAM blocks. Test and diagnosis of SRAM circuits are therefore an important challenge for improving quality of next generation integrated circuits. This paper proposes a flexible platform for testing and diagnosis of SRAM circuits. The architecture is based on the use of a low cost FPGA based board allowing high diagnosability while keeping costs at a very low leve

Fault-tolerant building-block computer study

Ultra-reliable core computers are required for improving the reliability of complex military systems. Such computers can provide reliable fault diagnosis, failure circumvention, and, in some cases serve as an automated repairman for their host systems. A small set of building-block circuits which can be implemented as single very large integration devices, and which can be used with off-the-shelf microprocessors and memories to build self checking computer modules (SCCM) is described. Each SCCM is a microcomputer which is capable of detecting its own faults during normal operation and is described to communicate with other identical modules over one or more Mil Standard 1553A buses. Several SCCMs can be connected into a network with backup spares to provide fault-tolerant operation, i.e. automated recovery from faults. Alternative fault-tolerant SCCM configurations are discussed along with the cost and reliability associated with their implementation

Fault-tolerant computer study

A set of building block circuits is described which can be used with commercially available microprocessors and memories to implement fault tolerant distributed computer systems. Each building block circuit is intended for VLSI implementation as a single chip. Several building blocks and associated processor and memory chips form a self checking computer module with self contained input output and interfaces to redundant communications buses. Fault tolerance is achieved by connecting self checking computer modules into a redundant network in which backup buses and computer modules are provided to circumvent failures. The requirements and design methodology which led to the definition of the building block circuits are discussed

Synthesis for circuit reliability

textElectrical and Computer Engineerin

A VLSI synthesis of a Reed-Solomon processor for digital communication systems

The Reed-Solomon codes have been widely used in digital communication systems such as computer networks, satellites, VCRs, mobile communications and high- definition television (HDTV), in order to protect digital data against erasures, random and burst errors during transmission. Since the encoding and decoding algorithms for such codes are computationally intensive, special purpose hardware implementations are often required to meet the real time requirements. -- One motivation for this thesis is to investigate and introduce reconfigurable Galois field arithmetic structures which exploit the symmetric properties of available architectures. Another is to design and implement an RS encoder/decoder ASIC which can support a wide family of RS codes. -- An m-programmable Galois field multiplier which uses the standard basis representation of the elements is first introduced. It is then demonstrated that the exponentiator can be used to implement a fast inverter which outperforms the available inverters in GF(2m). Using these basic structures, an ASIC design and synthesis of a reconfigurable Reed-Solomon encoder/decoder processor which implements a large family of RS codes is proposed. The design is parameterized in terms of the block length n, Galois field symbol size m, and error correction capability t for the various RS codes. The design has been captured using the VHDL hardware description language and mapped onto CMOS standard cells available in the 0.8-µm BiCMOS design kits for Cadence and Synopsys tools. The experimental chip contains 218,206 logic gates and supports values of the Galois field symbol size m = 3,4,5,6,7,8 and error correction capability t = 1,2,3, ..., 16. Thus, the block length n is variable from 7 to 255. Error correction t and Galois field symbol size m are pin-selectable. -- Since low design complexity and high throughput are desired in the VLSI chip, the algebraic decoding technique has been investigated instead of the time or transform domain. The encoder uses a self-reciprocal generator polynomial which structures the codewords in a systematic form. At the beginning of the decoding process, received words are initially stored in the first-in-first-out (FIFO) buffer as they enter the syndrome module. The Berlekemp-Massey algorithm is used to determine both the error locator and error evaluator polynomials. The Chien Search and Forney's algorithms operate sequentially to solve for the error locations and error values respectively. The error values are exclusive or-ed with the buffered messages in order to correct the errors, as the processed data leave the chip

On Fault Tolerance Methods for Networks-on-Chip

Technology scaling has proceeded into dimensions in which the reliability of manufactured devices is becoming endangered. The reliability decrease is a consequence of physical limitations, relative increase of variations, and decreasing noise margins, among others. A promising solution for bringing the reliability of circuits back to a desired level is the use of design methods which introduce tolerance against possible faults in an integrated circuit. This thesis studies and presents fault tolerance methods for network-onchip (NoC) which is a design paradigm targeted for very large systems-onchip. In a NoC resources, such as processors and memories, are connected to a communication network; comparable to the Internet. Fault tolerance in such a system can be achieved at many abstraction levels. The thesis studies the origin of faults in modern technologies and explains the classification to transient, intermittent and permanent faults. A survey of fault tolerance methods is presented to demonstrate the diversity of available methods. Networks-on-chip are approached by exploring their main design choices: the selection of a topology, routing protocol, and flow control method. Fault tolerance methods for NoCs are studied at different layers of the OSI reference model. The data link layer provides a reliable communication link over a physical channel. Error control coding is an efficient fault tolerance method especially against transient faults at this abstraction level. Error control coding methods suitable for on-chip communication are studied and their implementations presented. Error control coding loses its effectiveness in the presence of intermittent and permanent faults. Therefore, other solutions against them are presented. The introduction of spare wires and split transmissions are shown to provide good tolerance against intermittent and permanent errors and their combination to error control coding is illustrated. At the network layer positioned above the data link layer, fault tolerance can be achieved with the design of fault tolerant network topologies and routing algorithms. Both of these approaches are presented in the thesis together with realizations in the both categories. The thesis concludes that an optimal fault tolerance solution contains carefully co-designed elements from different abstraction levelsSiirretty Doriast

NASA SERC 1990 Symposium on VLSI Design

This document contains papers presented at the first annual NASA Symposium on VLSI Design. NASA's involvement in this event demonstrates a need for research and development in high performance computing. High performance computing addresses problems faced by the scientific and industrial communities. High performance computing is needed in: (1) real-time manipulation of large data sets; (2) advanced systems control of spacecraft; (3) digital data transmission, error correction, and image compression; and (4) expert system control of spacecraft. Clearly, a valuable technology in meeting these needs is Very Large Scale Integration (VLSI). This conference addresses the following issues in VLSI design: (1) system architectures; (2) electronics; (3) algorithms; and (4) CAD tools

A static RAM chip with on-chip error correction

This paper describes a 2-kb CMOS static RAM with on-chip error-correction capability (ECCRAM chip). The chip employs the linear sum code (LSC) technique to perform error detection and correction. The ECCRAM chip has been fabricated in a double-metal scalable CMOS process with 3-µm feature size. Testing results of the actual chip shows a significant improvement in random error tolerance