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1 research outputs found
Gate length dependence of bias temperature instability behavior in short channel SOI MOSFETs
Author
Alam
Chang Liu
+20Â more
Grasser
Grasser
Grasser
Heng Wu
Huard
J. Lu
Jiabao Sun
Kaczer
Liao
Miura
Pae
Prasad
Rui Zhang
Shen
Wangran Wu
Wenjie Yu
Xi Wang
Xiaoyu Tang
Xie
Yi Zhao
Publication venue
'Elsevier BV'
Publication date
Field of study
No full text
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