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    Degree Sequences and Long Cycles in Graphs

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    Let GG be a graph on nn vertices with degree sequence δ=d1d2...dn\delta=d_1\le d_2\le...\le d_n. Let cc be the circumference - the order of a longest cycle and pp the order of a longest path in GG. In 1952, Dirac proved: (i) every graph with 2d1n2d_1\ge n is hamiltonian; (ii) in every 2-connected graph, cmin{p,2d1}c\ge \min\{p,2d_1\}. Recently, the bounds 2d1n2d_1\ge n and cmin{p,2d1}c\ge \min\{p,2d_1\} in (i) and (ii) are improved to 2dδn2d_\delta\ge n and cmin{p,2dδ}c\ge \min\{p,2d_\delta\}, respectively, by Koulakzian, Mosesyan and Nikoghosyan. In this paper we present two new sharp bounds dδ+dδ+1nd_\delta+d_{\delta+1}\ge n and min{2dδ+1,dδ+dδ+2}n\min\{2d_{\delta+1},d_\delta+d_{\delta+2}\}\ge n instead of 2dδn2d_\delta\ge n, as well as two new sharp bounds cmin{p,dδ+dδ+1}c\ge \min\{p,d_\delta+d_{\delta+1}\} and cmin{p,2dδ+1,dδ+dδ+2}c\ge \min\{p,2d_{\delta+1},d_\delta+d_{\delta+2}\} instead of cmin{p,2dδ}c\ge \min\{p,2d_\delta\}.Comment: 9 page

    Stability of Ge-related point defects and complexes in Ge-doped SiO_2

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    We analyze Ge-related defects in Ge-doped SiO_2 using first-principles density functional techniques. Ge is incorporated at the level of ~ 1 mol % and above. The growth conditions of Ge:SiO_2 naturally set up oxygen deficiency, with vacancy concentration increasing by a factor 10^5 over undoped SiO_2, and O vacancies binding strongly to Ge impurities. All the centers considered exhibit potentially EPR-active states, candidates for the identification of the Ge(n) centers. Substitutional Ge produces an apparent gap shrinking via its extrinsic levels.Comment: RevTeX 4 pages, 2 ps figure

    Stability of Ge-related point defects and complexes in Ge-doped SiO_2

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    We analyze Ge-related defects in Ge-doped SiO_2 using first-principles density functional techniques. Ge is incorporated at the level of ~ 1 mol % and above. The growth conditions of Ge:SiO_2 naturally set up oxygen deficiency, with vacancy concentration increasing by a factor 10^5 over undoped SiO_2, and O vacancies binding strongly to Ge impurities. All the centers considered exhibit potentially EPR-active states, candidates for the identification of the Ge(n) centers. Substitutional Ge produces an apparent gap shrinking via its extrinsic levels.Comment: RevTeX 4 pages, 2 ps figure

    The impacts of surface conditions on the vapor-liquid-solid growth of germanium nanowires on Si (100) substrate

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    The impacts of surface conditions on the growth of Ge nanowires on a Si (100) substrate are discussed in detail. On SiO2-terminated Si substrates, high-density Ge nanowires can be easily grown. However, on H-terminated Si substrates, growing Ge nanowires is more complex. The silicon migration and the formation of a native SiO2 overlayer on a catalyst surface retard the growth of Ge nanowires. After removing this overlayer in the HF solution, high-density and well-ordered Ge nanowires are grown. Ge nanowires cross vertically and form two sets of parallel nanowires. It is found that nanowires grew along ?110? direction
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