APEnet+: high bandwidth 3D torus direct network for petaflops scale commodity clusters

We describe herein the APElink+ board, a PCIe interconnect adapter featuring the latest advances in wire speed and interface technology plus hardware support for a RDMA programming model and experimental acceleration of GPU networking; this design allows us to build a low latency, high bandwidth PC cluster, the APEnet+ network, the new generation of our cost-effective, tens-of-thousands-scalable cluster network architecture. Some test results and characterization of data transmission of a complete testbench, based on a commercial development card mounting an Altera FPGA, are provided.Comment: 6 pages, 7 figures, proceeding of CHEP 2010, Taiwan, October 18-2

Proposal of an Adaptive Fault Tolerance Mechanism to Tolerate Intermittent Faults in RAM

[EN] Due to transistor shrinking, intermittent faults are a major concern in current digital systems. This work presents an adaptive fault tolerance mechanism based on error correction codes (ECC), able to modify its behavior when the error conditions change without increasing the redundancy. As a case example, we have designed a mechanism that can detect intermittent faults and swap from an initial generic ECC to a specific ECC capable of tolerating one intermittent fault. We have inserted the mechanism in the memory system of a 32-bit RISC processor and validated it by using VHDL simulation-based fault injection. We have used two (39, 32) codes: a single error correction-double error detection (SEC-DED) and a code developed by our research group, called EPB3932, capable of correcting single errors and double and triple adjacent errors that include a bit previously tagged as error-prone. The results of injecting transient, intermittent, and combinations of intermittent and transient faults show that the proposed mechanism works properly. As an example, the percentage of failures and latent errors is 0% when injecting a triple adjacent fault after an intermittent stuck-at fault. We have synthesized the adaptive fault tolerance mechanism proposed in two types of FPGAs: non-reconfigurable and partially reconfigurable. In both cases, the overhead introduced is affordable in terms of hardware, time and power consumption.This research was supported in part by the Spanish Government, project TIN2016-81,075-R, and by Primeros Proyectos de Investigacion (PAID-06-18), Vicerrectorado de Investigacion, Innovacion y Transferencia de la Universitat Politecnica de Valencia (UPV), project 20190032.Baraza Calvo, JC.; Gracia-Morán, J.; Saiz-Adalid, L.; Gil Tomás, DA.; Gil, P. (2020). Proposal of an Adaptive Fault Tolerance Mechanism to Tolerate Intermittent Faults in RAM. Electronics. 9(12):1-30. https://doi.org/10.3390/electronics9122074S130912International Technology Roadmap for Semiconductors (ITRS)http://www.itrs2.net/2013-itrs.htmlJeng, S.-L., Lu, J.-C., & Wang, K. (2007). A Review of Reliability Research on Nanotechnology. IEEE Transactions on Reliability, 56(3), 401-410. doi:10.1109/tr.2007.903188Ibe, E., Taniguchi, H., Yahagi, Y., Shimbo, K., & Toba, T. (2010). Impact of Scaling on Neutron-Induced Soft Error in SRAMs From a 250 nm to a 22 nm Design Rule. IEEE Transactions on Electron Devices, 57(7), 1527-1538. doi:10.1109/ted.2010.2047907Boussif, A., Ghazel, M., & Basilio, J. C. (2020). Intermittent fault diagnosability of discrete event systems: an overview of automaton-based approaches. Discrete Event Dynamic Systems, 31(1), 59-102. doi:10.1007/s10626-020-00324-yConstantinescu, C. (2003). Trends and challenges in VLSI circuit reliability. IEEE Micro, 23(4), 14-19. doi:10.1109/mm.2003.1225959Bondavalli, A., Chiaradonna, S., Di Giandomenico, F., & Grandoni, F. (2000). Threshold-based mechanisms to discriminate transient from intermittent faults. IEEE Transactions on Computers, 49(3), 230-245. doi:10.1109/12.841127Contant, O., Lafortune, S., & Teneketzis, D. (2004). Diagnosis of Intermittent Faults. Discrete Event Dynamic Systems, 14(2), 171-202. doi:10.1023/b:disc.0000018570.20941.d2Sorensen, B. A., Kelly, G., Sajecki, A., & Sorensen, P. W. (s. f.). An analyzer for detecting intermittent faults in electronic devices. Proceedings of AUTOTESTCON ’94. doi:10.1109/autest.1994.381590Gracia-Moran, J., Gil-Tomas, D., Saiz-Adalid, L. J., Baraza, J. C., & Gil-Vicente, P. J. (2010). Experimental validation of a fault tolerant microcomputer system against intermittent faults. 2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN). doi:10.1109/dsn.2010.5544288Fujiwara, E. (2005). Code Design for Dependable Systems. doi:10.1002/0471792748Hamming, R. W. (1950). Error Detecting and Error Correcting Codes. Bell System Technical Journal, 29(2), 147-160. doi:10.1002/j.1538-7305.1950.tb00463.xSaiz-Adalid, L.-J., Gil-Vicente, P.-J., Ruiz-García, J.-C., Gil-Tomás, D., Baraza, J.-C., & Gracia-Morán, J. (2013). Flexible Unequal Error Control Codes with Selectable Error Detection and Correction Levels. Computer Safety, Reliability, and Security, 178-189. doi:10.1007/978-3-642-40793-2_17Frei, R., McWilliam, R., Derrick, B., Purvis, A., Tiwari, A., & Di Marzo Serugendo, G. (2013). Self-healing and self-repairing technologies. The International Journal of Advanced Manufacturing Technology, 69(5-8), 1033-1061. doi:10.1007/s00170-013-5070-2Maiz, J., Hareland, S., Zhang, K., & Armstrong, P. (s. f.). Characterization of multi-bit soft error events in advanced SRAMs. IEEE International Electron Devices Meeting 2003. doi:10.1109/iedm.2003.1269335Schroeder, B., Pinheiro, E., & Weber, W.-D. (2011). DRAM errors in the wild. Communications of the ACM, 54(2), 100-107. doi:10.1145/1897816.1897844BanaiyanMofrad, A., Ebrahimi, M., Oboril, F., Tahoori, M. B., & Dutt, N. (2015). Protecting caches against multi-bit errors using embedded erasure coding. 2015 20th IEEE European Test Symposium (ETS). doi:10.1109/ets.2015.7138735Kim, J., Sullivan, M., Lym, S., & Erez, M. (2016). All-Inclusive ECC: Thorough End-to-End Protection for Reliable Computer Memory. 2016 ACM/IEEE 43rd Annual International Symposium on Computer Architecture (ISCA). doi:10.1109/isca.2016.60Hwang, A. A., Stefanovici, I. A., & Schroeder, B. (2012). Cosmic rays don’t strike twice. ACM SIGPLAN Notices, 47(4), 111-122. doi:10.1145/2248487.2150989Gil-Tomás, D., Gracia-Morán, J., Baraza-Calvo, J.-C., Saiz-Adalid, L.-J., & Gil-Vicente, P.-J. (2012). Studying the effects of intermittent faults on a microcontroller. Microelectronics Reliability, 52(11), 2837-2846. doi:10.1016/j.microrel.2012.06.004Plasma CPU Modelhttps://opencores.org/projects/plasmaArlat, J., Aguera, M., Amat, L., Crouzet, Y., Fabre, J.-C., Laprie, J.-C., … Powell, D. (1990). Fault injection for dependability validation: a methodology and some applications. IEEE Transactions on Software Engineering, 16(2), 166-182. doi:10.1109/32.44380Gil-Tomas, D., Gracia-Moran, J., Baraza-Calvo, J.-C., Saiz-Adalid, L.-J., & Gil-Vicente, P.-J. (2012). Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection. IEEE Design & Test of Computers, 29(6), 66-73. doi:10.1109/mdt.2011.2179514Rashid, L., Pattabiraman, K., & Gopalakrishnan, S. (2010). Modeling the Propagation of Intermittent Hardware Faults in Programs. 2010 IEEE 16th Pacific Rim International Symposium on Dependable Computing. doi:10.1109/prdc.2010.52Amiri, M., Siddiqui, F. M., Kelly, C., Woods, R., Rafferty, K., & Bardak, B. (2016). FPGA-Based Soft-Core Processors for Image Processing Applications. Journal of Signal Processing Systems, 87(1), 139-156. doi:10.1007/s11265-016-1185-7Hailesellasie, M., Hasan, S. R., & Mohamed, O. A. (2019). MulMapper: Towards an Automated FPGA-Based CNN Processor Generator Based on a Dynamic Design Space Exploration. 2019 IEEE International Symposium on Circuits and Systems (ISCAS). doi:10.1109/iscas.2019.8702589Mittal, S. (2018). A survey of FPGA-based accelerators for convolutional neural networks. Neural Computing and Applications, 32(4), 1109-1139. doi:10.1007/s00521-018-3761-1Intel Completes Acquisition of Alterahttps://newsroom.intel.com/news-releases/intel-completes-acquisition-of-altera/#gs.mi6ujuAMD to Acquire Xilinx, Creating the Industry’s High Performance Computing Leaderhttps://www.amd.com/en/press-releases/2020-10-27-amd-to-acquire-xilinx-creating-the-industry-s-high-performance-computingKim, K. H., & Lawrence, T. F. (s. f.). Adaptive fault tolerance: issues and approaches. [1990] Proceedings. Second IEEE Workshop on Future Trends of Distributed Computing Systems. doi:10.1109/ftdcs.1990.138292Gonzalez, O., Shrikumar, H., Stankovic, J. A., & Ramamritham, K. (s. f.). Adaptive fault tolerance and graceful degradation under dynamic hard real-time scheduling. Proceedings Real-Time Systems Symposium. doi:10.1109/real.1997.641271Jacobs, A., George, A. D., & Cieslewski, G. (2009). Reconfigurable fault tolerance: A framework for environmentally adaptive fault mitigation in space. 2009 International Conference on Field Programmable Logic and Applications. doi:10.1109/fpl.2009.5272313Shin, D., Park, J., Park, J., Paul, S., & Bhunia, S. (2017). Adaptive ECC for Tailored Protection of Nanoscale Memory. IEEE Design & Test, 34(6), 84-93. doi:10.1109/mdat.2016.2615844Silva, F., Muniz, A., Silveira, J., & Marcon, C. (2020). CLC-A: An Adaptive Implementation of the Column Line Code (CLC) ECC. 2020 33rd Symposium on Integrated Circuits and Systems Design (SBCCI). doi:10.1109/sbcci50935.2020.9189901Mukherjee, S. S., Emer, J., Fossum, T., & Reinhardt, S. K. (s. f.). Cache scrubbing in microprocessors: myth or necessity? 10th IEEE Pacific Rim International Symposium on Dependable Computing, 2004. Proceedings. doi:10.1109/prdc.2004.1276550Saleh, A. M., Serrano, J. J., & Patel, J. H. (1990). Reliability of scrubbing recovery-techniques for memory systems. IEEE Transactions on Reliability, 39(1), 114-122. doi:10.1109/24.52622X9SRA User’s Manual (Rev. 1.1)https://www.manualshelf.com/manual/supermicro/x9sra/user-s-manual-1-1.htmlChishti, Z., Alameldeen, A. R., Wilkerson, C., Wu, W., & Lu, S.-L. (2009). Improving cache lifetime reliability at ultra-low voltages. Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture - Micro-42. doi:10.1145/1669112.1669126Datta, R., & Touba, N. A. (2011). Designing a fast and adaptive error correction scheme for increasing the lifetime of phase change memories. 29th VLSI Test Symposium. doi:10.1109/vts.2011.5783773Kim, J., Lim, J., Cho, W., Shin, K.-S., Kim, H., & Lee, H.-J. (2016). Adaptive Memory Controller for High-performance Multi-channel Memory. JSTS:Journal of Semiconductor Technology and Science, 16(6), 808-816. doi:10.5573/jsts.2016.16.6.808Yuan, L., Liu, H., Jia, P., & Yang, Y. (2015). Reliability-Based ECC System for Adaptive Protection of NAND Flash Memories. 2015 Fifth International Conference on Communication Systems and Network Technologies. doi:10.1109/csnt.2015.23Zhou, Y., Wu, F., Lu, Z., He, X., Huang, P., & Xie, C. (2019). SCORE. ACM Transactions on Architecture and Code Optimization, 15(4), 1-25. doi:10.1145/3291052Lu, S.-K., Li, H.-P., & Miyase, K. (2018). Adaptive ECC Techniques for Reliability and Yield Enhancement of Phase Change Memory. 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS). doi:10.1109/iolts.2018.8474118Chen, J., Andjelkovic, M., Simevski, A., Li, Y., Skoncej, P., & Krstic, M. (2019). Design of SRAM-Based Low-Cost SEU Monitor for Self-Adaptive Multiprocessing Systems. 2019 22nd Euromicro Conference on Digital System Design (DSD). doi:10.1109/dsd.2019.00080Wang, X., Jiang, L., & Chakrabarty, K. (2020). LSTM-based Analysis of Temporally- and Spatially-Correlated Signatures for Intermittent Fault Detection. 2020 IEEE 38th VLSI Test Symposium (VTS). doi:10.1109/vts48691.2020.9107600Ebrahimi, H., & G. Kerkhoff, H. (2018). Intermittent Resistance Fault Detection at Board Level. 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). doi:10.1109/ddecs.2018.00031Ebrahimi, H., & Kerkhoff, H. G. (2020). A New Monitor Insertion Algorithm for Intermittent Fault Detection. 2020 IEEE European Test Symposium (ETS). doi:10.1109/ets48528.2020.9131563Hsiao, M. Y. (1970). A Class of Optimal Minimum Odd-weight-column SEC-DED Codes. IBM Journal of Research and Development, 14(4), 395-401. doi:10.1147/rd.144.0395Benso, A., & Prinetto, P. (Eds.). (2004). Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation. Frontiers in Electronic Testing. doi:10.1007/b105828Gracia, J., Saiz, L. J., Baraza, J. C., Gil, D., & Gil, P. J. (2008). Analysis of the influence of intermittent faults in a microcontroller. 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems. doi:10.1109/ddecs.2008.4538761ZC702 Evaluation Board for the Zynq-7000 XC7Z020 SoChttps://www.xilinx.com/support/documentation/boards_and_kits/zc702_zvik/ug850-zc702-eval-bd.pd

Self-repairing mobile robotic car using astrocyte-neuron networks

A self-repairing robot utilising a spiking astrocyte-neuron network is presented in this paper. It uses the output spike frequency of neurons to control the motor speed and robot activation. A software model of the astrocyte-neuron network previously demonstrated self-detection of faults and its self-repairing capability. In this paper the application demonstrator of mobile robotics is employed to evaluate the fault-tolerant capabilities of the astrocyte-neuron network when implemented in a hardware-based robotic car system. Results demonstrated that when 20% or less synapses associated with a neuron are faulty, the robot car can maintain system performance and complete the task of forward motion correctly. If 80% synapses are faulty, the system performance shows a marginal degradation, however this degradation is much smaller than that of conventional fault-tolerant techniques under the same levels of faults. This is the first time that astrocyte cells merged within spiking neurons demonstrates a self-repairing capabilities in the hardware system for a real application

On the Resilience of RTL NN Accelerators: Fault Characterization and Mitigation

Machine Learning (ML) is making a strong resurgence in tune with the massive generation of unstructured data which in turn requires massive computational resources. Due to the inherently compute- and power-intensive structure of Neural Networks (NNs), hardware accelerators emerge as a promising solution. However, with technology node scaling below 10nm, hardware accelerators become more susceptible to faults, which in turn can impact the NN accuracy. In this paper, we study the resilience aspects of Register-Transfer Level (RTL) model of NN accelerators, in particular, fault characterization and mitigation. By following a High-Level Synthesis (HLS) approach, first, we characterize the vulnerability of various components of RTL NN. We observed that the severity of faults depends on both i) application-level specifications, i.e., NN data (inputs, weights, or intermediate), NN layers, and NN activation functions, and ii) architectural-level specifications, i.e., data representation model and the parallelism degree of the underlying accelerator. Second, motivated by characterization results, we present a low-overhead fault mitigation technique that can efficiently correct bit flips, by 47.3% better than state-of-the-art methods.Comment: 8 pages, 6 figure

Towards a Dependable True Random Number Generator With Self-Repair Capabilities

Many secure-critical systems rely on true random number generators that must guarantee their operational functionality during its intended life. To this end, these generators are subject to intensive online testing in order to discover any flaws in their operation. The dependability of the different blocks that compose the system is crucial to guarantee the security. In this paper, we provide some general guidelines for designers to create more dependable true random number generators. In addition, a case of study where the system dependability has been improved is presented.This work was supported in part by ICT COST Action under Grant IC1204 and in part by the Spanish Ministry of Economy and Competitiveness under Grant ESP2015-68245-C4-1-P

MANAGING AND LEVERAGING VARIATIONS AND NOISE IN NANOMETER CMOS

Advanced CMOS technologies have enabled high density designs at the cost of complex fabrication process. Variation in oxide thickness and Random Dopant Fluctuation (RDF) lead to variation in transistor threshold voltage Vth. Current photo-lithography process used for printing decreasing critical dimensions result in variation in transistor channel length and width. A related challenge in nanometer CMOS is that of on-chip random noise. With decreasing threshold voltage and operating voltage; and increasing operating temperature, CMOS devices are more sensitive to random on-chip noise in advanced technologies. In this thesis, we explore novel circuit techniques to manage the impact of process variation in nanometer CMOS technologies. We also analyze the impact of on-chip noise on CMOS circuits and propose techniques to leverage or manage impact of noise based on the application. True Random Number Generator (TRNG) is an interesting cryptographic primitive that leverages on-chip noise to generate random bits; however, it is highly sensitive to process variation. We explore novel metastability circuits to alleviate the impact of variations and at the same time leverage on-chip noise sources like Random Thermal Noise and Random Telegraph Noise (RTN) to generate high quality random bits. We develop stochastic models for metastability based TRNG circuits to analyze the impact of variation and noise. The stochastic models are used to analyze and compare low power, energy efficient and lightweight post-processing techniques targeted to low power applications like System on Chip (SoC) and RFID. We also propose variation aware circuit calibration techniques to increase reliability. We extended this technique to a more generic application of designing Post-Si Tunable (PST) clock buffers to increase parametric yield in the presence of process variation. Apart from one time variation due to fabrication process, transistors undergo constant change in threshold voltage due to aging/wear-out effects and RTN. Process variation affects conventional sensors and introduces inaccuracies during measurement. We present a lightweight wear-out sensor that is tolerant to process variation and provides a fine grained wear-out sensing. A similar circuit is designed to sense fluctuation in transistor threshold voltage due to RTN. Although thermal noise and RTN are leveraged in applications like TRNG, they affect the stability of sensitive circuits like Static Random Access Memory (SRAM). We analyze the impact of on-chip noise on Bit Error Rate (BER) and post-Si test coverage of SRAM cells

Scalable Test Generators for High-Speed Datapath Circuits

This paper explores the design of efficient test sets and test-pattern generators for on-line BIST. The target applications are high-performance, scalable datapath circuits for which fast and complete fault coverage is required. Because of the presence of carry-lookahead, most existing BIST methods are unsuitable for these applications. High-level models are used to identify potential test sets for a small version of the circuit to be tested. Then a regular test set is extracted and a test generator TG is designed to meet the following goals: scalability, small test set size, full fault coverage, and very low hardware overhead. TG takes the form of a twisted ring counter with a small decoder array. We apply our technique to various datapath circuits including a carry-lookahead adder, an arithmetic-logic unit, and a multiplier-adder.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/43010/1/10836_2004_Article_154697.pd

Digital Design of New Chaotic Ciphers for Ethernet Traffic

Durante los últimos años, ha habido un gran desarrollo en el campo de la criptografía, y muchos algoritmos de encriptado así como otras funciones criptográficas han sido propuestos.Sin embargo, a pesar de este desarrollo, hoy en día todavía existe un gran interés en crear nuevas primitivas criptográficas o mejorar las ya existentes. Algunas de las razones son las siguientes:• Primero, debido el desarrollo de las tecnologías de la comunicación, la cantidad de información que se transmite está constantemente incrementándose. En este contexto, existen numerosas aplicaciones que requieren encriptar una gran cantidad de datos en tiempo real o en un intervalo de tiempo muy reducido. Un ejemplo de ello puede ser el encriptado de videos de alta resolución en tiempo real. Desafortunadamente, la mayoría de los algoritmos de encriptado usados hoy en día no son capaces de encriptar una gran cantidad de datos a alta velocidad mientras mantienen altos estándares de seguridad.• Debido al gran aumento de la potencia de cálculo de los ordenadores, muchos algoritmos que tradicionalmente se consideraban seguros, actualmente pueden ser atacados por métodos de “fuerza bruta” en una cantidad de tiempo razonable. Por ejemplo, cuando el algoritmo de encriptado DES (Data Encryption Standard) fue lanzado por primera vez, el tamaño de la clave era sólo de 56 bits mientras que, hoy en día, el NIST (National Institute of Standards and Technology) recomienda que los algoritmos de encriptado simétricos tengan una clave de, al menos, 112 bits. Por otro lado, actualmente se está investigando y logrando avances significativos en el campo de la computación cuántica y se espera que, en el futuro, se desarrollen ordenadores cuánticos a gran escala. De ser así, se ha demostrado que algunos algoritmos que se usan actualmente como el RSA (Rivest Shamir Adleman) podrían ser atacados con éxito.• Junto al desarrollo en el campo de la criptografía, también ha habido un gran desarrollo en el campo del criptoanálisis. Por tanto, se están encontrando nuevas vulnerabilidades y proponiendo nuevos ataques constantemente. Por consiguiente, es necesario buscar nuevos algoritmos que sean robustos frente a todos los ataques conocidos para sustituir a los algoritmos en los que se han encontrado vulnerabilidades. En este aspecto, cabe destacar que algunos algoritmos como el RSA y ElGamal están basados en la suposición de que algunos problemas como la factorización del producto de dos números primos o el cálculo de logaritmos discretos son difíciles de resolver. Sin embargo, no se ha descartado que, en el futuro, se puedan desarrollar algoritmos que resuelvan estos problemas de manera rápida (en tiempo polinomial).• Idealmente, las claves usadas para encriptar los datos deberían ser generadas de manera aleatoria para ser completamente impredecibles. Dado que las secuencias generadas por generadores pseudoaleatorios, PRNGs (Pseudo Random Number Generators) son predecibles, son potencialmente vulnerables al criptoanálisis. Por tanto, las claves suelen ser generadas usando generadores de números aleatorios verdaderos, TRNGs (True Random Number Generators). Desafortunadamente, los TRNGs normalmente generan los bits a menor velocidad que los PRNGs y, además, las secuencias generadas suelen tener peores propiedades estadísticas, lo que hace necesario que pasen por una etapa de post-procesado. El usar un TRNG de baja calidad para generar claves, puede comprometer la seguridad de todo el sistema de encriptado, como ya ha ocurrido en algunas ocasiones. Por tanto, el diseño de nuevos TRNGs con buenas propiedades estadísticas es un tema de gran interés.En resumen, es claro que existen numerosas líneas de investigación en el ámbito de la criptografía de gran importancia. Dado que el campo de la criptografía es muy amplio, esta tesis se ha centra en tres líneas de investigación: el diseño de nuevos TRNGs, el diseño de nuevos cifradores de flujo caóticos rápidos y seguros y, finalmente, la implementación de nuevos criptosistemas para comunicaciones ópticas Gigabit Ethernet a velocidades de 1 Gbps y 10 Gbps. Dichos criptosistemas han estado basados en los algoritmos caóticos propuestos, pero se han adaptado para poder realizar el encriptado en la capa física, manteniendo el formato de la codificación. De esta forma, se ha logrado que estos sistemas sean capaces no sólo de encriptar los datos sino que, además, un atacante no pueda saber si se está produciendo una comunicación o no. Los principales aspectos cubiertos en esta tesis son los siguientes:• Estudio del estado del arte, incluyendo los algoritmos de encriptado que se usan actualmente. En esta parte se analizan los principales problemas que presentan los algoritmos de encriptado standard actuales y qué soluciones han sido propuestas. Este estudio es necesario para poder diseñar nuevos algoritmos que resuelvan estos problemas.• Propuesta de nuevos TRNGs adecuados para la generación de claves. Se exploran dos diferentes posibilidades: el uso del ruido generado por un acelerómetro MEMS (Microelectromechanical Systems) y el ruido generado por DNOs (Digital Nonlinear Oscillators). Ambos casos se analizan en detalle realizando varios análisis estadísticos a secuencias obtenidas a distintas frecuencias de muestreo. También se propone y se implementa un algoritmo de post-procesado simple para mejorar la aleatoriedad de las secuencias generadas. Finalmente, se discute la posibilidad de usar estos TRNGs como generadores de claves. • Se proponen nuevos algoritmos de encriptado que son rápidos, seguros y que pueden implementarse usando una cantidad reducida de recursos. De entre todas las posibilidades, esta tesis se centra en los sistemas caóticos ya que, gracias a sus propiedades intrínsecas como la ergodicidad o su comportamiento similar al comportamiento aleatorio, pueden ser una buena alternativa a los sistemas de encriptado clásicos. Para superar los problemas que surgen cuando estos sistemas son digitalizados, se proponen y estudian diversas estrategias: usar un sistema de multi-encriptado, cambiar los parámetros de control de los sistemas caóticos y perturbar las órbitas caóticas.• Se implementan los algoritmos propuestos. Para ello, se usa una FPGA Virtex 7. Las distintas implementaciones son analizadas y comparadas, teniendo en cuenta diversos aspectos tales como el consumo de potencia, uso de área, velocidad de encriptado y nivel de seguridad obtenido. Uno de estos diseños, se elige para ser implementado en un ASIC (Application Specific Integrate Circuit) usando una tecnología de 0,18 um. En cualquier caso, las soluciones propuestas pueden ser también implementadas en otras plataformas y otras tecnologías.• Finalmente, los algoritmos propuestos se adaptan y aplican a comunicaciones ópticas Gigabit Ethernet. En particular, se implementan criptosistemas que realizan el encriptado al nivel de la capa física para velocidades de 1 Gbps y 10 Gbps. Para realizar el encriptado en la capa física, los algoritmos propuestos en las secciones anteriores se adaptan para que preserven el formato de la codificación, 8b/10b en el caso de 1 Gb Ethernet y 64b/10b en el caso de 10 Gb Ethernet. En ambos casos, los criptosistemas se implementan en una FPGA Virtex 7 y se diseña un set experimental, que incluye dos módulos SFP (Small Form-factor Pluggable) capaces de transmitir a una velocidad de hasta 10.3125 Gbps sobre una fibra multimodo de 850 nm. Con este set experimental, se comprueba que los sistemas de encriptado funcionan correctamente y de manera síncrona. Además, se comprueba que el encriptado es bueno (pasa todos los test de seguridad) y que el patrón del tráfico de datos está oculto.<br /

Survey of FPGA applications in the period 2000 – 2015 (Technical Report)

Romoth J, Porrmann M, Rückert U. Survey of FPGA applications in the period 2000 – 2015 (Technical Report).; 2017.Since their introduction, FPGAs can be seen in more and more different fields of applications. The key advantage is the combination of software-like flexibility with the performance otherwise common to hardware. Nevertheless, every application field introduces special requirements to the used computational architecture. This paper provides an overview of the different topics FPGAs have been used for in the last 15 years of research and why they have been chosen over other processing units like e.g. CPUs

Constant-Overhead Fault-Tolerant Quantum Computation with Reconfigurable Atom Arrays

Quantum low-density parity-check (qLDPC) codes can achieve high encoding rates and good code distance scaling, providing a promising route to low-overhead fault-tolerant quantum computing. However, the long-range connectivity required to implement such codes makes their physical realization challenging. Here, we propose a hardware-efficient scheme to perform fault-tolerant quantum computation with high-rate qLDPC codes on reconfigurable atom arrays, directly compatible with recently demonstrated experimental capabilities. Our approach utilizes the product structure inherent in many qLDPC codes to implement the non-local syndrome extraction circuit via atom rearrangement, resulting in effectively constant overhead in practically relevant regimes. We prove the fault tolerance of these protocols, perform circuit-level simulations of memory and logical operations with these codes, and find that our qLDPC-based architecture starts to outperform the surface code with as few as several hundred physical qubits at a realistic physical error rate of $10^{-3}$. We further find that less than 3000 physical qubits are sufficient to obtain over an order of magnitude qubit savings compared to the surface code, and quantum algorithms involving thousands of logical qubits can be performed using less than $10^5$ physical qubits. Our work paves the way for explorations of low-overhead quantum computing with qLDPC codes at a practical scale, based on current experimental technologies