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1 research outputs found
Experimental study and numerical investigation on the formation of single event gate damages induced on medium voltage power MOSFET
Author
Busatto Giovanni
Curro’ G.
+4Â more
Iannuzzo Francesco
Porzio A.
Sanseverino Annunziata
Velardi Francesco
Publication venue
'Elsevier BV'
Publication date
01/01/2010
Field of study
No full text
IRIS Unicas (Università degli Studi di Cassino e del Lazio Meridionale)