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3 research outputs found
Dopant profile extraction and dielectric characterization using scanning capacitance microscopy
Author
YAN JIAN
Publication venue
Publication date
30/01/2006
Field of study
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Master'sMASTER OF ENGINEERIN
ScholarBank@NUS
Experimental investigation of the dielectric-semiconductor interface with scanning capacitance microscopy
Author
Bialkowski M.
Kopanski J. J.
Postula A.
Yang J.
Publication venue
'Elsevier BV'
Publication date
01/01/2005
Field of study
No full text
University of Queensland eSpace
Dielectric characterization and dopant profile extraction using scanning capacitance microscopy
Author
WONG KIN MUN
Publication venue
Publication date
18/04/2007
Field of study
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Ph.DDOCTOR OF PHILOSOPH
ScholarBank@NUS