Hardware Fault Injection

Hardware fault injection is the widely accepted approach to evaluate the behavior of a circuit in the presence of faults. Thus, it plays a key role in the design of robust circuits. This chapter presents a comprehensive review of hardware fault injection techniques, including physical and logical approaches. The implementation of effective fault injection systems is also analyzed. Particular emphasis is made on the recently developed emulation-based techniques, which can provide large flexibility along with unprecedented levels of performance. These capabilities provide a way to tackle reliability evaluation of complex circuits.Publicad

Cross-layer Soft Error Analysis and Mitigation at Nanoscale Technologies

This thesis addresses the challenge of soft error modeling and mitigation in nansoscale technology nodes and pushes the state-of-the-art forward by proposing novel modeling, analyze and mitigation techniques. The proposed soft error sensitivity analysis platform accurately models both error generation and propagation starting from a technology dependent device level simulations all the way to workload dependent application level analysis

A Survey of Fault-Injection Methodologies for Soft Error Rate Modeling in Systems-on-Chips

The development of process technology has increased system performance, but the system failure probability has also significantly increased. It is important to consider the system reliability in addition to the cost, performance, and power consumption. In this paper, we describe the types of faults that occur in a system and where these faults originate. Then, fault-injection techniques, which are used to characterize the fault rate of a system-on-chip (SoC), are investigated to provide a guideline to SoC designers for the realization of resilient SoCs

Exploring Design Dimensions in Flash-based Mass-memory Devices

Mission-critical space system applications present several issues: a typical one is the design of a mass-memory device (i.e., a solid- state recorder). This goal could be accomplished by using flash- memories: the exploration of a huge number of parameters and trade-offs is needed. On the one hand flash-memories are nonvolatile, shock-resistant and power-economic, but on the other hand their cost is higher than normal hard disk, the number of erasure cycles is bounded and other different drawbacks have to be considered. In addition space environment presents various issues especially because of radiations: the design of a flash- memory based solid-state recorder implies the exploration of different and quite often contrasting dimensions. No systematic approach has so far been proposed to consider them all as a whole: as a consequence the design of flash-based mass-memory device for space applications is intended to be supported by a novel design environment currently under development and refinemen

FLARE: A design environment for FLASH-based space applications

Designing a mass-memory device (i.e., a solid-state recorder) is one of the typical issues of mission-critical space system applications. Flash-memories could be used for this goal: a huge number of parameters and trade-offs need to be explored. Flash-memories are nonvolatile, shock-resistant and power-economic, but in turn have different drawback: e.g., their cost is higher than normal hard disk and the number of erasure cycles is bounded. Moreover space environment presents various issues especially because of radiations: different and quite often contrasting dimensions need to be explored during the design of a flash-memory based solid-state recorder. No systematic approach has so far been proposed to consider them all as a whole: as a consequence a novel design environment currently under development is aimed at supporting the design of flash-based mass-memory device for space application

Survey of Soft Error Mitigation Techniques Applied to LEON3 Soft Processors on SRAM-Based FPGAs

Soft-core processors implemented in SRAM-based FPGAs are an attractive option for applications to be employed in radiation environments due to their flexibility, relatively-low application development costs, and reconfigurability features enabling them to adapt to the evolving mission needs. Despite the advantages soft-core processors possess, they are seldom used in critical applications because they are more sensitive to radiation than their hard-core counterparts. For instance, both the logic and signal routing circuitry of a soft-core processor as well as its user memory are susceptible to radiation-induced faults. Therefore, soft-core processors must be appropriately hardened against ionizing-radiation to become a feasible design choice for harsh environments and thus to reap all their benefits. This survey henceforth discusses various techniques to protect the configuration and user memories of an LEON3 soft processor, which is one of the most widely used soft-core processors in radiation environments, as reported in the state-of-the-art literature, with the objective of facilitating the choice of right fault-mitigation solution for any given soft-core processor

Self-Test Mechanisms for Automotive Multi-Processor System-on-Chips

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Autonomous fault emulation: a new FPGA-based acceleration system for hardness evaluation

The appearance of nanometer technologies has produced a significant increase of integrated circuit sensitivity to radiation, making the occurrence of soft errors much more frequent, not only in applications working in harsh environments, like aerospace circuits, but also for applications working at the earth surface. Therefore, hardened circuits are currently demanded in many applications where fault tolerance was not a concern in the very near past. To this purpose, efficient hardness evaluation solutions are required to deal with the increasing size and complexity of modern VLSI circuits. In this paper, a very fast and cost effective solution for SEU sensitivity evaluation is presented. The proposed approach uses FPGA emulation in an autonomous manner to fully exploit the FPGA emulation speed. Three different techniques to implement it are proposed and analyzed. Experimental results show that the proposed Autonomous Emulation approach can reach execution rates higher than one million faults per second, providing a performance improvement of two orders of magnitude with respect to previous approaches. These rates give way to consider very large fault injection campaigns that were not possible in the past.This work was supported by the Directorate of Research of Madrid Community Government, Spain (Code 07/0052/2003 2) and by the European Commission and Spanish Government under MEDEA+ Project (PARACHUTE-2A701) and PROFIT Project (CIRCE-FIT-330100-2005-60)

An Approach to Emulate and Validate the Effects of Single Event Upsets using the PREDICT FUTRE Hardware Integrated Framework

Due to the advances in electronics design automation industry, worldwide, the integrated approach to model and emulate the single event effects due to cosmic radiation, in particular single event upsets or single event transients is gaining momentum. As of now, no integrated methodology to inject the fault in parallel to functional test vectors or to estimate the effects of radiation for a selected function in system on chip at design phase exists. In this paper, a framework, PRogrammable single Event effects Demonstrator for dIgital Chip Technologies (PREDICT) failure assessment for radiation effects is developed using a hardware platform and aided by genetic algorithms addressing all the above challenges. A case study is carried out to evaluate the frameworks capability to emulate the effects of radiation using the co-processor as design under test (DUT) function. Using the ML605 and Virtex-6 evaluation board for single and three particle simulations with the layered atmospheric conditions, the proposed framework consumes approximately 100 min and 300 min, respectively; it consumes 600 min for 3 particle random atmospheric conditions, using the 64 GB RAM, 64-bit operating system with 3.1 GHz processor based workstation. The framework output transforms the 4 MeVcm2/mg linear energy transfer to a single event transient pulse width of 2 μs with 105 amplification factor for visualisation, which matches well with the existing experimental results data. Using the framework, the effects of radiation for the co-processing module are estimated during the design phase and the success rate of the DUT is found to be 48 per cent

Toward Fault-Tolerant Applications on Reconfigurable Systems-on-Chip

L'abstract è presente nell'allegato / the abstract is in the attachmen