Integrated Design and Implementation of Embedded Control Systems with Scilab

Embedded systems are playing an increasingly important role in control engineering. Despite their popularity, embedded systems are generally subject to resource constraints and it is therefore difficult to build complex control systems on embedded platforms. Traditionally, the design and implementation of control systems are often separated, which causes the development of embedded control systems to be highly time-consuming and costly. To address these problems, this paper presents a low-cost, reusable, reconfigurable platform that enables integrated design and implementation of embedded control systems. To minimize the cost, free and open source software packages such as Linux and Scilab are used. Scilab is ported to the embedded ARM-Linux system. The drivers for interfacing Scilab with several communication protocols including serial, Ethernet, and Modbus are developed. Experiments are conducted to test the developed embedded platform. The use of Scilab enables implementation of complex control algorithms on embedded platforms. With the developed platform, it is possible to perform all phases of the development cycle of embedded control systems in a unified environment, thus facilitating the reduction of development time and cost.Comment: 15 pages, 14 figures; Open Access at http://www.mdpi.org/sensors/papers/s8095501.pd

Testing Embedded Memories in Telecommunication Systems

Extensive system testing is mandatory nowadays to achieve high product quality. Telecommunication systems are particularly sensitive to such a requirement; to maintain market competitiveness, manufacturers need to combine reduced costs, shorter life cycles, advanced technologies, and high quality. Moreover, strict reliability constraints usually impose very low fault latencies and a high degree of fault detection for both permanent and transient faults. This article analyzes major problems related to testing complex telecommunication systems, with particular emphasis on their memory modules, often so critical from the reliability point of view. In particular, advanced BIST-based solutions are analyzed, and two significant industrial case studies presente

Embedded Software Design for Mechatronic Systems

This research project is motivated by the fact that nowadays it is impossible to separate control engineering from software engineering. Besides that both of them can be found in definitions of mechatronics, this project deals with exploitation and improvement of their strong natural interdependency. In all modern reactive systems, what all mechatronics systems are, one will always find one or more embedded computers. The functionality of these computers, and in turn controlled systems, is powered by embedded software [1]

Actual Test Coverage for Embedded Systems

Testing embedded systems is inherently incomplete; no test suite will ever be able to test all possible usage scenarios. Therefore, in the past decades many coverage measures have been developed. These measures denote the portion of a system that is tested, that way providing a quality criterion for test suites. Formulating coverage criteria is not an easy task. The measures provided in the literature are consequently almost all very trivial and syntax-dependent. Well-known examples are statement and path coverage in white-box testing, and state and transition coverage in black-box testing. The complexity of designing coverage measures for embedded systems is contained in the highly dynamic behaviour of such systems, which is state-dependent and subject to many interleavings. In this talk we introduce a framework on actual test coverage. This measure denotes the number of faults actually shown present or absent. Our framework contains a method to evaluate the actual coverage of a given set of test suite executions after testing has taken place, providing a means to express the quality of a testing process. It also contains a method to predict the actual coverage a certain number of executions will yield, providing a means to select the best test suite. Both the evaluation afterwards and the prediction in advance are quite efficient, making it feasible to implement the theory in a tool and use it in a practical context

Sensitivity-based multistep MPC for embedded systems

In model predictive control (MPC), an optimization problem is solved every sampling instant to determine an optimal control for a physical system. We aim to accelerate this procedure for fast systems applications and address the challenge of implementing the resulting MPC scheme on an embedded system with limited computing power. We present the sensitivity-based multistep MPC, a strategy which considerably reduces the computing requirements in terms of floating point operations (FLOPs), compared to a standard MPC formulation, while fulfilling closed- loop performance expectations. We illustrate by applying the method to a DC-DC converter model and show how a designer can optimally trade off closed-loop performance considerations with computing requirements in order to fit the controller into a resource-constrained embedded system

Trimmed trees and embedded particle systems

In a supercritical branching particle system, the trimmed tree consists of those particles which have descendants at all times. We develop this concept in the superprocess setting. For a class of continuous superprocesses with Feller underlying motion on compact spaces, we identify the trimmed tree, which turns out to be a binary splitting particle system with a new underlying motion that is a compensated h-transform of the old one. We show how trimmed trees may be estimated from above by embedded binary branching particle systems.Comment: Published by the Institute of Mathematical Statistics (http://www.imstat.org) in the Annals of Probability (http://www.imstat.org/aop/) at http://dx.doi.org/10.1214/00911790400000009