Imaging ellipsometry of graphene

Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical constants of graphene in the visible range with high lateral resolution. In this way the influence of the substrate on graphene's optical properties can be investigatedComment: 3 pages, 3 figure

Optical properties of carbon nanofiber photonic crystals

Carbon nanofibers (CNF) are used as components of planar photonic crystals. Square and rectangular lattices and random patterns of vertically aligned CNF were fabricated and their properties studied using ellipsometry. We show that detailed information such as symmetry directions and the band structure of these novel materials can be extracted from considerations of the polarization state in the specular beam. The refractive index of the individual nanofibers was found to be n_CNF = 4.1.Comment: 10 pages, 4 figure

Low-temperature far-infrared ellipsometry of convergent beam

Development of an ellipsometry to the case of a coherent far infrared irradiation, low temperatures and small samples is described, including a decision of the direct and inverse problems of the convergent beam ellipsometry for an arbitrary wavelength, measurement technique and a compensating orientation of cryostat windows. Experimental results are presented: for a gold film and UBe13 single crystal at room temperature (lambda=119 um), temperature dependencies of the complex dielectric function of SrTiO3 (lambda=119, 84 and 28 um) and of YBa2Cu3O7-delta ceramic (lambda=119 um).Comment: 14 pages, 6 figure