9 research outputs found

    Reconfigurable system on an FPGA

    Get PDF

    Développement des techniques de test et de diagnostic pour les FPGA hiérarchique de type mesh

    Get PDF
    The evolution trend of shrinking feature size and increasing complexity in modern electronics is being slowed down due to physical limits that generate numerous imperfections and defects during fabrication steps or projected life time of the chip. Field Programmable Gate Arrays (FPGAs) are used in complex digital systems mainly due to their reconfigurability and shorter time-to-market. To maintain a high reliability of such systems, FPGAs should be tested thoroughly for defects. FPGA architecture optimization for area saving and better signal routability is an ongoing process which directly impacts the overall FPGA testability, hence the reliability. This thesis presents a complete strategy for test and diagnosis of manufacturing defects in mesh-based FPGAs containing a novel multilevel interconnects topology which promises to provide better area and routability. Efficiency of the proposed test schemes is analyzed in terms of test cost, respective fault coverage and diagnostic resolution.L’évolution tendant à réduire la taille et augmenter la complexité des circuits électroniques modernes, est en train de ralentir du fait des limitations technologiques, qui génèrent beaucoup de d’imperfections et de defaults durant la fabrication ou la durée de vie de la puce. Les FPGAs sont utilisés dans les systèmes numériques complexes, essentiellement parce qu’ils sont reconfigurables et rapide à commercialiser. Pour garder une grande fiabilité de tels systèmes, les FPGAs doivent être testés minutieusement pour les defaults. L’optimisation de l’architecture des FPGAs pour l’économie de surface et une meilleure routabilité est un processus continue qui impacte directement la testabilité globale et de ce fait, la fiabilité. Cette thèse présente une stratégie complète pour le test et le diagnostique des defaults de fabrication des “mesh-based FPGA” contenant une nouvelle topologie d’interconnections à plusieurs niveaux, ce qui promet d’apporter une meilleure routabilité. Efficacité des schémas proposes est analysée en termes de temps de test, couverture de faute et résolution de diagnostique

    Achieving Low-overhead Fault Tolerance for Parallel Accelerators with Dynamic Partial Reconfiguration

    No full text
    © 2014 Technical University of Munich (TUM).While allowing for the fabrication of increasingly complex and efficient circuitry, transistor shrinkage and count-per-device expansion have major downsides: chiefly increased variation, degradation and fault susceptibility. For this reason, design-time consideration of fault tolerance will have to be given to increasing numbers of electronic systems in the future to ensure yields, reliabilities and lifetimes remain acceptably high. Many commonly implemented operators are suited to modification resulting in datapath error detection capabilities with low area overheads. FPGAs are uniquely placed to allow further area savings to be made when incorporating fault avoidance mechanisms thanks to their dynamic reconfigurability. In this paper, we examine the practicalities and costs involved in implementing hardware-software fault tolerance on a test platform: a parallel matrix multiplication accelerator in hardware, with controller in software, running on a Xilinx Zynq system-on-chip. A combination of bolt-on error detection logic and software-triggered routing reconfiguration serve to provide low-overhead datapath fault tolerance at runtime. Rapid yet accurate fault diagnoses along with low hardware (area), software (configuration storage) and performance penalties are achieved

    Autonomous Recovery Of Reconfigurable Logic Devices Using Priority Escalation Of Slack

    Get PDF
    Field Programmable Gate Array (FPGA) devices offer a suitable platform for survivable hardware architectures in mission-critical systems. In this dissertation, active dynamic redundancy-based fault-handling techniques are proposed which exploit the dynamic partial reconfiguration capability of SRAM-based FPGAs. Self-adaptation is realized by employing reconfiguration in detection, diagnosis, and recovery phases. To extend these concepts to semiconductor aging and process variation in the deep submicron era, resilient adaptable processing systems are sought to maintain quality and throughput requirements despite the vulnerabilities of the underlying computational devices. A new approach to autonomous fault-handling which addresses these goals is developed using only a uniplex hardware arrangement. It operates by observing a health metric to achieve Fault Demotion using Recon- figurable Slack (FaDReS). Here an autonomous fault isolation scheme is employed which neither requires test vectors nor suspends the computational throughput, but instead observes the value of a health metric based on runtime input. The deterministic flow of the fault isolation scheme guarantees success in a bounded number of reconfigurations of the FPGA fabric. FaDReS is then extended to the Priority Using Resource Escalation (PURE) online redundancy scheme which considers fault-isolation latency and throughput trade-offs under a dynamic spare arrangement. While deep-submicron designs introduce new challenges, use of adaptive techniques are seen to provide several promising avenues for improving resilience. The scheme developed is demonstrated by hardware design of various signal processing circuits and their implementation on a Xilinx Virtex-4 FPGA device. These include a Discrete Cosine Transform (DCT) core, Motion Estimation (ME) engine, Finite Impulse Response (FIR) Filter, Support Vector Machine (SVM), and Advanced Encryption Standard (AES) blocks in addition to MCNC benchmark circuits. A iii significant reduction in power consumption is achieved ranging from 83% for low motion-activity scenes to 12.5% for high motion activity video scenes in a novel ME engine configuration. For a typical benchmark video sequence, PURE is shown to maintain a PSNR baseline near 32dB. The diagnosability, reconfiguration latency, and resource overhead of each approach is analyzed. Compared to previous alternatives, PURE maintains a PSNR within a difference of 4.02dB to 6.67dB from the fault-free baseline by escalating healthy resources to higher-priority signal processing functions. The results indicate the benefits of priority-aware resiliency over conventional redundancy approaches in terms of fault-recovery, power consumption, and resource-area requirements. Together, these provide a broad range of strategies to achieve autonomous recovery of reconfigurable logic devices under a variety of constraints, operating conditions, and optimization criteria

    Built-in-Self-Test of FPGAs with Provable Diagnosabilities and High Diagnostic Coverage with Application to On-Line Testing

    No full text
    Abstract — We present novel and efficient methods for builtin-self-test (BIST) of FPGAs for detection and diagnosis of permanent faults in current as well as emerging technologies that are expected to have high fault densities. Our basic BIST methods can be used in both on-line as well as off-line testing scenarios, though we focus on the former in this paper. We present 1- and 2-diagnosable BISTer designs that make up a ROving TEster (ROTE). Due to their provable diagnosabilities, these BISTers can avoid time-intensive adaptive diagnosis without significantly compromising diagnostic coverage—the percentage of faults correctly diagnosed. We also develop functional testing methods that test programmable logic blocks ( PLBs) in only two circuit functions that will be mapped to them as the ROTE moves across a functioning FPGA. We extend our basic BISTer designs to those with test-pattern generators (TPGs) using multiple PLBs to more efficiently test the complex PLBs of current commercial FPGAs, and prove the diagnosabilities of these designs as well. Simulation results show that our 1-diagnosable functional-test based BISTer with a 3-PLB TPG has very high diagnostic coverages—for example, for a random fault distribution, our nonadaptive diagnosis methods provide diagnostic coverages of 96% and 88 % at fault densities of 10 % and 25%, respectively, while the previous best non-adaptive diagnosis method of the  ¢¡¤ £ STAR-BISTer has diagnostic coverages of about 75 % and 55% at these fault densities. Index Terms — built-in self-test (BIST), ¥-diagnosability, diagnostic coverage, FPGAs, functional testing, on-line testing, roving tester. I

    Efficient On-line Testing of FPGAs with Provable Diagnosabilities

    No full text
    We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than prior FPGA testing methods. We present 1- and 2-diagnosable built-in self-tester (BISTer) designs that make up the ROTE, and that avoid expensive adaptive diagnosis. To the best of our knowledge, this is the first time that a BISTer design with diagnosability greater than one has been developed for FPGAs. We also develop functional testing methods that test PLBs in only two circuit functions that will be mapped to them (as opposed to testing PLBs in all their operational modes) as the ROTE moves across a functioning FPGA. Simulation results show that our 1-diagnosable BISTer and our functional testing technique leads to significantly more accurate (98 % (90.5%) fault coverage at a fault/defect density of 10 % (25%)) and faster test-and-diagnosis of FPGAs than achieved by previous work. In general, it is expected that ROTE will achieve high fault coverages at fault/defect densities of up to 25 % using our 1-diagnosable BISTer and up to 33 % using our 2-diagnosable BISTer. Our methods should thus prove useful for testing current very deep submicron FPGAs as well as future nano-CMOS and molecular nanotechnology FP-GAs in which defect densities are expected to be in the 10 % range

    Reconfigurable system on an FPGA

    Get PDF
    Práce se zabývá tvorbou metodiky návrhu rekonfigurovatelného systému na FPGA obvodu. Tato metodika využívá pokročilých technik založených na částečné dynamické rekonfiguraci za účelem optimalizace rekonfigurovatelných systémů z hlediska flexibility, vyžadované paměti, času potřebného pro implementaci návrhu a množství logických zdrojů FPGA obvodu nezbytného pro vytvoření rekonfigurovatelného systému. V textu jsou představeny základní pojmy z oblastí struktury a konfigurace FPGA obvodů, dále pak základní vlastnosti částečné rekonfigurace, relokace částečných konfiguračních souborů, vyčítání konfigurační paměti FPGA a zapisování dat do interních registrů obvodu. Jádro práce představuje metodiku návrhu rekonfigurovatelného systému s využitím výše zmíněných technik. Dílčí části této práce jsou ověřeny na různých experimentech. V závěru jsou shrnuty výsledky jednotlivých přístupů a diskutovány přínosy použitých technik.This work is focused on a methodology of the reconfigurable system design implemented on an FPGA. This methodology uses advanced techniques based on a partial dynamic reconfiguration in order to optimize a reconfigurable system in terms of system's flexibility, memory requirements, implementation time requirements and logic sources consumption.The text describes basics of the FPGA structure and important features of the dynamic partial reconfiguration, partial bitstream relocation, FPGA's configuration memory readback and FPGA's internal registers states restoration techniques.The main part of the work presents a design methodology of the reconfigurable system where all mentioned techniques are supported. Individual parts of this work were verified on several applications with different sizes. Conclusion summarizes the results of the different approaches and discussed the benefits of the involved techniques
    corecore