62,056 research outputs found

    Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction

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    © 2016 The AuthorsDislocations in geological minerals are fundamental to the creep processes that control large-scale geodynamic phenomena. However, techniques to quantify their densities, distributions, and types over critical subgrain to polycrystal length scales are limited. The recent advent of high-angular resolution electron backscatter diffraction (HR-EBSD), based on diffraction pattern cross-correlation, offers a powerful new approach that has been utilised to analyse dislocation densities in the materials sciences. In particular, HR-EBSD yields significantly better angular resolution (<0.01°) than conventional EBSD (~0.5°), allowing very low dislocation densities to be analysed. We develop the application of HR-EBSD to olivine, the dominant mineral in Earths upper mantle by testing (1) different inversion methods for estimating geometrically necessary dislocation (GND) densities, (2) the sensitivity of the method under a range of data acquisition settings, and (3) the ability of the technique to resolve a variety of olivine dislocation structures. The relatively low crystal symmetry (orthorhombic) and few slip systems in olivine result in well constrained GND density estimates. The GND density noise floor is inversely proportional to map step size, such that datasets can be optimised for analysing either short wavelength, high density structures (e.g. subgrain boundaries) or long wavelength, low amplitude orientation gradients. Comparison to conventional images of decorated dislocations demonstrates that HR-EBSD can characterise the dislocation distribution and reveal additional structure not captured by the decoration technique. HR-EBSD therefore provides a highly effective method for analysing dislocations in olivine and determining their role in accommodating macroscopic deformation

    The 1999 Center for Simulation of Dynamic Response in Materials Annual Technical Report

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    Introduction: This annual report describes research accomplishments for FY 99 of the Center for Simulation of Dynamic Response of Materials. The Center is constructing a virtual shock physics facility in which the full three dimensional response of a variety of target materials can be computed for a wide range of compressive, ten- sional, and shear loadings, including those produced by detonation of energetic materials. The goals are to facilitate computation of a variety of experiments in which strong shock and detonation waves are made to impinge on targets consisting of various combinations of materials, compute the subsequent dy- namic response of the target materials, and validate these computations against experimental data

    Terrace grading of SiGe for high-quality virtual substrates

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    Silicon germanium (SiGe) virtual substrates of final germanium composition x = 0.50 have been fabricated using solid-source molecular beam epitaxy with a thickness of 2 µm. A layer structure that helps limit the size of dislocation pileups associated with the modified Frank–Read dislocation multiplication mechanism has been studied. It is shown that this structure can produce lower threading dislocation densities than conventional linearly graded virtual substrates. Cross-sectional transmission electron microscopy shows the superior quality of the dislocation network in the graded regions with a lower rms roughness shown by atomic force microscopy. X-ray diffractometry shows these layers to be highly relaxed. This method of Ge grading suggests that high-quality virtual substrates can be grown considerably thinner than with conventional grading methods

    Compression Stress Effect on Dislocations Movement and Crack propagation in Cubic Crystal

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    Fracture material is seriously problem in daily life, and it has connection with mechanical properties itself. The mechanical properties is belief depend on dislocation movement and crack propagation in the crystal. Information about this is very important to characterize the material. In FCC crystal structure the competition between crack propagation and dislocation wake is very interesting, in a ductile material like copper (Cu) dislocation can be seen in room temperature, but in a brittle material like Si only cracks can be seen observed. Different techniques were applied to material to study the mechanical properties, in this study we did compression test in one direction. Combination of simulation and experimental on cubic material are reported in this paper. We found that the deflection of crack direction in Si caused by vacancy of lattice,while compression stress on Cu cause the atoms displacement in one direction. Some evidence of dislocation wake in Si crystal under compression stress at high temperature will reported

    Realistic time-scale fully atomistic simulations of surface nucleation of dislocations in pristine nanopillars

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    We use our recently proposed accelerated dynamics algorithm (Tiwary and van de Walle, 2011) to calculate temperature and stress dependence of activation free energy for surface nucleation of dislocations in pristine Gold nanopillars under realistic loads. While maintaining fully atomistic resolution, we achieve the fraction of a second time-scale regime. We find that the activation free energy depends significantly and non-linearly on the driving force (stress or strain) and temperature, leading to very high activation entropies. We also perform compression tests on Gold nanopillars for strain-rates varying between 7 orders of magnitudes, reaching as low as 10^3/s. Our calculations bring out the perils of high strain-rate Molecular Dynamics calculations: we find that while the failure mechanism for compression of Gold nanopillars remains the same across the entire strain-rate range, the elastic limit (defined as stress for nucleation of the first dislocation) depends significantly on the strain-rate. We also propose a new methodology that overcomes some of the limits in our original accelerated dynamics scheme (and accelerated dynamics methods in general). We lay out our methods in sufficient details so as to be used for understanding and predicting deformation mechanism under realistic driving forces for various problems

    Buried dislocation networks designed to organize the growth of III-V semiconductor nanostructures

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    We first report a detailed transmission electron microscopy study of dislocation networks (DNs) formed at shallowly buried interfaces obtained by bonding two GaAs crystals between which we establish in a controlled manner a twist and a tilt around a k110l direction. For large enough twists, the DN consists of a twodimensional network of screw dislocations accommodating mainly the twist and of a one-dimensional network of mixed dislocations accommodating mainly the tilt. We show that in addition the mixed dislocations accommodate part of the twist and we observe and explain slight unexpected disorientations of the screw dislocations with respect to the k110l directions. By performing a quantitative analysis of the whole DN, we propose a coherent interpretation of these observations which also provides data inaccessible by direct experiments. When the twist is small enough, one screw subnetwork vanishes. The surface strain field induced by such DNs has been used to pilot the lateral ordering of GaAs and InGaAs nanostructures during metal-organic vapor phase epitaxy. We prove that the dimensions and orientations of the nanostructures are correlated with those of the cells of the underlying DN and explain how the interface dislocation structure governs the formation of the nanostructures
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