DOI 10.1007/s10836-012-5332-1 Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLAB ®

Abstract A manufacturing defect is a finite chip area with electrically malfunctioning circuitry caused by fabrication errors. The fraction of defective chips that escapes to the customer is called the defect level, also known as defective parts per million (DPPM, or simply PPM) when normalized to one million units. This paper demonstrates a technique used to correlate coverage goals to DPPM based on test fallout data using a MATLAB ®-based error function minimization approach. This analysis is explained using regression models for DPPM yield versus fault/defect coverage. This approach is beneficial to semiconductor companies for calibrating their fault coverage goals to meet DPPM requirements from automotive or other customers that have very aggressive (i.e., ultra-low) DPPM demands

J Electron Test DOI 10.1007/s10836-012-5332-1 Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLAB ®

Abstract A manufacturing defect is a finite chip area with electrically malfunctioning circuitry caused by fabrication errors. The fraction of defective chips that escapes to the customer is called the defect level, also known as defective parts per million (DPPM, or simply PPM) when normalized to one million units. This paper demonstrates a technique used to correlate coverage goals to DPPM based on test fallout data using a MATLAB ®-based error function minimization approach. This analysis is explained using regression models for DPPM yield versus fault/defect coverage. This approach is beneficial to semiconductor companies for calibrating their fault coverage goals to meet DPPM requirements from automotive or other customers that have very aggressive (i.e., ultra-low) DPPM demands