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    2 research outputs found

    Circuit Simulation for Fault Sensitivity Analysis and Its Application to Cryptographic LSI

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      'Institute of Electrical and Electronics Engineers (IEEE)'
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      故障注入を用いた暗号モジュールの動作解析に関する研究

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      Tohoku University青木孝文課
      Tohoku University Repository (TOUR) / 東北大学機関リポジトリ
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