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2 research outputs found
Single event upset hardened embedded domain specific reconfigurable architecture
Author
Baloch Sajid
Publication venue
The University of Edinburgh
Publication date
01/01/2007
Field of study
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Edinburgh Research Archive
CACOP - A Random Pattern Testability Analyzer
Author
Publication venue
'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
01/01/1993
Field of study
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