Holographic stress analysis

Device for nondestructive testing of soldered joints correlates stress with load to predict printed circuit board lifetime

Nondestructive testing techniques for multilayer printed wiring boards Final report, 30 Jun. 1964 - 30 Sep. 1965

Nondestructive testing techniques for laminated printed circuit board

The development of a standard for multilayer printed circuit boards by means of research, development, and testing Final report

Environmental testing and material characteristics of multilayer printed circuit board

Ptolemy: An instrument aboard the Rosetta lander Philae, to unlock the secrets of the solar system

Ptolemy is a miniature chemical analysis suite currently on board the ESA Rosetta comet lander Philae. This poster describes the operation of the instrument, and presents data generated thus far during a comprehensive ground testing programme

Thermal Characterization and Lifetime Prediction of LED Boards for SSL Lamp

This work presents a detailed 3-D thermo-mechanical modelling of two LED board technologies to compare their performance. LED board are considered to be used in high power 800 lumen retrofit SSL (Solid State Lighting) lamp. Thermal, mechanical and life time properties are evaluated by numerical modelling. Experimental results measured on fabricated LED board samples are compared to calculated data. Main role of LED board in SSL lamp is to transport heat from LED die to a heat sink and keep the thermal stresses in all layers as low as possible. The work focuses on improving of new LED board thermal management. Moreover, reliability and lifetime of LED board has been inspected by numerical calculation and validated by experiment. Thermally induced stress has been studied for wide temperature range that can affect the LED boards (-40 to +125°C). Numerical modelling of thermal performance, thermal stress distribution and lifetime has been carried out with ANSYS structural analysis where temperature dependent stress-strain material properties have been taken into account. The objective of this study is to improve not only the thermal performance of new LED board, but also identification of potential problems from mechanical fatigue point of view. Accelerated lifetime testing (e.g., mechanical) is carried out in order to study the failure behaviour of current and newly developed LED board

DFT and BIST of a multichip module for high-energy physics experiments

Engineers at Politecnico di Torino designed a multichip module for high-energy physics experiments conducted on the Large Hadron Collider. An array of these MCMs handles multichannel data acquisition and signal processing. Testing the MCM from board to die level required a combination of DFT strategie

An assessment of ground effects determined by static and dynamic testing techniques

A new testing technique was developed wherein the rate of descent can be included as a parameter in ground effects investigations. This technique simulates the rate of descent by horizontal motion of a model over an inclined ground board in the Langley Vortex Research Facility (VRF) During initial evaluations of the technique, dynamic ground effects data were obtained over the inclined ground board, steady state ground effects data were obtained over a flat portion of the ground board, and the results were compared to conventional static wind tunnel ground effect data both with and without a moving belt ground plane simulation. Initial testing and analysis led to the following conclusions: the moving belt ground plane had little effect on static ground effects for the configurations tested unless thrust reversers were employed; in general, rate-of-descent reduced ground effects to the point that for reversed thrust cases an expected loss of lift due to ground effects was eliminated at approach conditions; and, in general, the steady state results from the VRF matched static results obtained from the wind tunnel once the flow field stabilized over the flat portion of the ground board

Outcomes of Genetic Testing in a Genitourinary Genetics Clinic

Several known hereditary cancer syndromes confer an increased risk for genitourinary (GU)related malignancies. Various guidelines indicate when to refer patients to genetic counseling for GU-related hereditary cancer syndromes but there is limited research on the clinical picture of these patients, including their cancerous and non-cancerous features, the genetic testing strategy for this population, and the probability of having a positive germline mutation if testing is performed. The purpose of this study is to determine the most common indications for ordering genetic testing in a GU Genetics Clinic and evaluate whether there is a relationship between the indication for genetic testing and genetic testing outcome. An institutional review board-approved retrospective chart review was performed for 220 patients seen in the GU Genetics Clinic at M.D. Anderson Cancer Center. Patients were stratified into groups based on their indication for genetic testing and an exact binomial test was used to compare the proportion of patients with a positive genetic test from various groups. The majority of patients (92%) were seen for genetic evaluation related to either renal cell carcinoma (RCC) or prostate cancer. Among patients seen for RCC-related evaluation (N=107), meeting published clinical criteria for a hereditary RCC syndrome significantly predicted positive genetic testing (

Lessons and Recommendations for Board-Level Testing with Protons

Protons with sufficiently high energy, provided in a broad field covering on the order of 0.1m2 can be used to perform board-level testing for single event effects (SEE). NASA has used this approach for board-level testing over the last 20 years. Although many difficulties inherent in SEE testing are simplified when using a board-level test, including reduced cost, the method is inherently risky because of the limited value of the collected data and the potential to make critical mistakes when performing SEE testing this way, leading to data of less value. Historically, NASA’s approach to proton board-level testing has been limited to lower criticality applications. However, with users both inside and outside NASA using this method for higher levels of mission assurance, we have put together a set of lessons and recommendations to improve the value of data collected using this method. Focus areas covered include test preparation, test execution, and interpretation of results