New Techniques to Reduce the Execution Time of Functional Test Programs

The compaction of test programs for processor-based systems is of utmost practical importance: Software-Based Self-Test (SBST) is nowadays increasingly adopted, especially for in-field test of safety-critical applications, and both the size and the execution time of the test are critical parameters. However, while compacting the size of binary test sequences has been thoroughly studied over the years, the reduction of the execution time of test programs is still a rather unexplored area of research. This paper describes a family of algorithms able to automatically enhance an existing test program, reducing the time required to run it and, as a side effect, its size. The proposed solutions are based on instruction removal and restoration, which is shown to be computationally more efficient than instruction removal alone. Experimental results demonstrate the compaction capabilities, and allow analyzing computational costs and effectiveness of the different algorithms

Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement

Testing digital integrated circuits is generally done using Design-for-Testability (DfT) solutions. Such solutions, however, introduce non-negligible area and timing overheads that can be overcome by adopting functional solutions. In particular, functional test of integrated circuits plays a key role when guaranteeing the device's safety is required during the operative lifetime (in-field test), as required by standards like ISO26262. This can be achieved via the execution of a Self-Test Library (STL) by the device under test (DUT). Nevertheless, developing such test programs requires a significant manual effort, and can be non-trivial when dealing with complex modules. This paper moves the first step in defining a generic and systematic methodology to improve transition delay faults' observability of existing STLs. To do so, we analyze previously devised STLs in order to highlight specific points within test programs to be improved, leading to an increase in the final fault coverage

Application specific instruction set processor design for embedded application using the coware tool

An Application Specific Instruction Set Processor (ASIP) is widely used as a System on a Chip(SoC) Component. ASIPs possess an instruction set which is tai-lored to benefit a specific application. Such specialization allows ASIPs to serve as an intermediate between two dominant processor design styles- ASICs which has high processing abilities at the cost of limited programmability and Programmable solu-tions such as FPGAs that provide programming exibility at the cost of less energy eficiency. In this dissertation the goal is to design ASIP, keeping in mind a temper-ature sensor system. The platform used for processor design is LISA 2.0 description language and processor designing environment from CoWare. Coware processor de-signer allows processor architecture to be defined at an abstract level and automatic generation of chain of software tools like assembler, linker and simulator for functional verification followed by RTL level description. RTL level description is used to gen-erate synthesized report of the design using RTL compiler and finally the layout is created using Cadence encounter

Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries

International audienceIn-field test of integrated circuits using Self-Test Libraries (STLs) is a widely used technique specifically suited to guarantee the processor’s correct behavior during the operative lifetime, as mandated by functional safety standards such as ISO26262. Developing STLs for stuck-at faults requires significant manual efforts from test engineers, and targeting delay faults is even more challenging. In order to support this process, in this paper we propose a method to automate the creation of STLs targeting delay faults starting from existing STLs targeting stuck-at faults. The method is based first on identifying excited but not-observed transition delay faults and then adding suitable instructions able to detect them. Experimental results on a RISC-V processor show that the method can systematically detect a significant percentage of the target faults with reasonable computational effort and test code size increase

New Perspectives on Core In-field Path Delay Test

Path Delay fault test currently exploits DfT-based techniques, mainly relying on scan chains, widely supported by commercial tools. However, functional testing may be a desirable choice in this context because it allows to catch faults at-speed with no hardware overhead and it can be used both for endof-manufacturing tests and for in-field test. The purpose of this article is to compare the results that can be achieved with both approaches. This work is based on an open-source RISC-V-based processor core as benchmark device. Gathered results show that there is no correlation between stuck-at and path delay fault coverage, and provide guidelines for developing more effective functional test

On the design and implementation of a control system processor

In general digital control algorithms are multi-input multi-output (MIMO) recursive digital filters, but there are particular numerical requirements in control system processing for which standard processor devices are not well suited, in particular arising in systems with high sample rates. There is therefore a clear need to understand the numerical requirements properly, to identity optimised forms for implementing control laws, and to translate these into efficient processor architectures. By taking a considered view of the numerical and calculation requirements of control algorithms, it is possible to consider special purpose processors that provide well-targeted support of control laws. This thesis describes a compact, high-speed, special-purpose processor which offers a low-cost solution to implementing linear time invariant controllers. [Continues.

Applications in Electronics Pervading Industry, Environment and Society

This book features the manuscripts accepted for the Special Issue “Applications in Electronics Pervading Industry, Environment and Society—Sensing Systems and Pervasive Intelligence” of the MDPI journal Sensors. Most of the papers come from a selection of the best papers of the 2019 edition of the “Applications in Electronics Pervading Industry, Environment and Society” (APPLEPIES) Conference, which was held in November 2019. All these papers have been significantly enhanced with novel experimental results. The papers give an overview of the trends in research and development activities concerning the pervasive application of electronics in industry, the environment, and society. The focus of these papers is on cyber physical systems (CPS), with research proposals for new sensor acquisition and ADC (analog to digital converter) methods, high-speed communication systems, cybersecurity, big data management, and data processing including emerging machine learning techniques. Physical implementation aspects are discussed as well as the trade-off found between functional performance and hardware/system costs

FPGA ARCHITECTURE AND VERIFICATION OF BUILT IN SELF-TEST (BIST) FOR 32-BIT ADDER/SUBTRACTER USING DE0-NANO FPGA AND ANALOG DISCOVERY 2 HARDWARE

The integrated circuit (IC) is an integral part of everyday modern technology, and its application is very attractive to hardware and software design engineers because of its versatility, integration, power consumption, cost, and board area reduction. IC is available in various types such as Field Programming Gate Array (FPGA), Application Specific Integrated Circuit (ASIC), System on Chip (SoC) architecture, Digital Signal Processing (DSP), microcontrollers (μC), and many more. With technology demand focused on faster, low power consumption, efficient IC application, design engineers are facing tremendous challenges in developing and testing integrated circuits that guaranty functionality, high fault coverage, and reliability as the transistor technology is shrinking to the point where manufacturing defects of ICs are affecting yield which associates with the increased cost of the part. The competitive IC market is pressuring manufactures of ICs to develop and market IC in a relatively quick turnaround which in return requires design and verification engineers to develop an integrated self-test structure that would ensure fault-free and the quality product is delivered on the market. 70-80% of IC design is spent on verification and testing to ensure high quality and reliability for the enduser. To test complex and sophisticated IC designs, the verification engineers must produce laborious and costly test fixtures which affect the cost of the part on the competitive market. To avoid increasing the part cost due to yield and test time to the end-user and to keep up with the competitive market many IC design engineers are deviating from complex external test fixture approach and are focusing on integrating Built-in Self-Test (BIST) or Design for Test (DFT) techniques onto IC’s which would reduce time to market but still guarantee high coverage for the product. Understanding the BIST, the architecture, as well as the application of IC, must be understood before developing IC. The architecture of FPGA is elaborated in this paper followed by several BIST techniques and applications of those BIST relative to FPGA, SoC, analog to digital (ADC), or digital to analog converters (DAC) that are integrated on IC. Paper is concluded with verification of BIST for the 32-bit adder/subtracter designed in Quartus II software using the Analog Discovery 2 module as stimulus and DE0-NANO FPGA board for verification

hls4ml: An Open-Source Codesign Workflow to Empower Scientific Low-Power Machine Learning Devices

Accessible machine learning algorithms, software, and diagnostic tools for energy-efficient devices and systems are extremely valuable across a broad range of application domains. In scientific domains, real-time near-sensor processing can drastically improve experimental design and accelerate scientific discoveries. To support domain scientists, we have developed hls4ml, an open-source software-hardware codesign workflow to interpret and translate machine learning algorithms for implementation with both FPGA and ASIC technologies. We expand on previous hls4ml work by extending capabilities and techniques towards low-power implementations and increased usability: new Python APIs, quantization-aware pruning, end-to-end FPGA workflows, long pipeline kernels for low power, and new device backends include an ASIC workflow. Taken together, these and continued efforts in hls4ml will arm a new generation of domain scientists with accessible, efficient, and powerful tools for machine-learning-accelerated discovery.Comment: 10 pages, 8 figures, TinyML Research Symposium 202