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1 research outputs found
Analysis of high-power devices using proton beam induced charge microscopy
Author
Balk L.
Barthelmess R.
+8 more
Bettiol A.
Falck E.
Niedernostheide F.-J.
Osipowicz T.
Phang J.
Schulze H.-J.
Watt F.
Zmeck M.
Publication venue
'Elsevier BV'
Publication date
01/09/2001
Field of study
No full text
10.1016/S0026-2714(01)00159-7Microelectronics Reliability419-101519-1524MCRL
Crossref
ScholarBank@NUS