New Techniques to Reduce the Execution Time of Functional Test Programs

The compaction of test programs for processor-based systems is of utmost practical importance: Software-Based Self-Test (SBST) is nowadays increasingly adopted, especially for in-field test of safety-critical applications, and both the size and the execution time of the test are critical parameters. However, while compacting the size of binary test sequences has been thoroughly studied over the years, the reduction of the execution time of test programs is still a rather unexplored area of research. This paper describes a family of algorithms able to automatically enhance an existing test program, reducing the time required to run it and, as a side effect, its size. The proposed solutions are based on instruction removal and restoration, which is shown to be computationally more efficient than instruction removal alone. Experimental results demonstrate the compaction capabilities, and allow analyzing computational costs and effectiveness of the different algorithms

AN APPROACH TO DEVELOP INTELLIGENT DIGITAL TEST SYSTEMS

A new test generation method is developed for digital systems on the basis of alternative graphs. Tests are generated using symbolic signal values and are organized in the compact way - in form of symbolic test programs and data arrays. A new architecture is pro- posed for test systems which is suited for on-line generating deterministic test patterns in algorithmic way. Special features are implemented in test generator and tester to support event driven testing, which makes it possible to test dynamically devices that work at higher clock rates than the tester does

Event and Time-Triggered Control Module Layers for Individual Robot Control Architectures of Unmanned Agricultural Ground Vehicles

Automation in the agriculture sector has increased to an extent where the accompanying methods for unmanned field management are becoming more economically viable. This manifests in the industry’s recent presentation of conceptual cab-less machines that perform all field operations under the high-level task control of a single remote operator. A dramatic change in the overall workflow for field tasks that historically assumed the presence of a human in the immediate vicinity of the work is predicted. This shift in the entire approach to farm machinery work provides producers increased control and productivity over high-level tasks and less distraction from operating individual machine actuators and implements. The final implication is decreased mechanical complexity of the cab-less field machines from their manned counter types. An Unmanned Agricultural Ground Vehicle (UAGV) electric platform received a portable control module layer (CML) which was modular and able to accept higher-level mission commands while returning system states to high-level tasks. The simplicity of this system was shown by its entire implementation running on microcontrollers networked on a Time-Triggered Controller Area Network (TTCAN) bus. A basic form of user input and output was added to the system to demonstrate a simple instance of sub-system integration. In this work, all major levels of design and implementation are examined in detail, revealing the ‘why’ and ‘how’ of each subsystem. System design philosophy is highlighted from the beginning. A state-space feedback steering controller was implemented on the machine utilizing a basic steering model found in literature. Finally, system performance is evaluated from the perspectives of a number of disciplines including: embedded systems software design, control systems, and robot control architecture. Recommendations for formalized UAGV system modeling, estimation, and control are discussed for the continuation of research in simplified low-cost machines for in-field task automation. Additional recommendations for future time-triggered CML experiments in bus robustness and redundancy are discussed. The work presented is foundational in the shift from event-triggered communications towards time-triggered CMLs for unmanned agricultural machinery and is a front-to-back demonstration of time-triggered design. Advisor: Santosh K. Pitl

Custom Integrated Circuits

Contains table of contents for Part III, table of contents for Section 1 and reports on eleven research projects.IBM CorporationMIT School of EngineeringNational Science Foundation Grant MIP 94-23221Defense Advanced Research Projects Agency/U.S. Army Intelligence Center Contract DABT63-94-C-0053Mitsubishi CorporationNational Science Foundation Young Investigator Award Fellowship MIP 92-58376Joint Industry Program on Offshore Structure AnalysisAnalog DevicesDefense Advanced Research Projects AgencyCadence Design SystemsMAFET ConsortiumConsortium for Superconducting ElectronicsNational Defense Science and Engineering Graduate FellowshipDigital Equipment CorporationMIT Lincoln LaboratorySemiconductor Research CorporationMultiuniversity Research IntiativeNational Science Foundatio

Digital System Design - Use of Microcontroller

Embedded systems are today, widely deployed in just about every piece of machinery from toasters to spacecraft. Embedded system designers face many challenges. They are asked to produce increasingly complex systems using the latest technologies, but these technologies are changing faster than ever. They are asked to produce better quality designs with a shorter time-to-market. They are asked to implement increasingly complex functionality but more importantly to satisfy numerous other constraints. To achieve the current goals of design, the designer must be aware with such design constraints and more importantly, the factors that have a direct effect on them.One of the challenges facing embedded system designers is the selection of the optimum processor for the application in hand; single-purpose, general-purpose or application specific. Microcontrollers are one member of the family of the application specific processors.The book concentrates on the use of microcontroller as the embedded system?s processor, and how to use it in many embedded system applications. The book covers both the hardware and software aspects needed to design using microcontroller.The book is ideal for undergraduate students and also the engineers that are working in the field of digital system design.Contents• Preface;• Process design metrics;• A systems approach to digital system design;• Introduction to microcontrollers and microprocessors;• Instructions and Instruction sets;• Machine language and assembly language;• System memory; Timers, counters and watchdog timer;• Interfacing to local devices / peripherals;• Analogue data and the analogue I/O subsystem;• Multiprocessor communications;• Serial Communications and Network-based interfaces

New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks

Digital System Design - Use of Microcontroller

Embedded systems are today, widely deployed in just about every piece of machinery from toasters to spacecraft. Embedded system designers face many challenges. They are asked to produce increasingly complex systems using the latest technologies, but these technologies are changing faster than ever. They are asked to produce better quality designs with a shorter time-to-market. They are asked to implement increasingly complex functionality but more importantly to satisfy numerous other constraints. To achieve the current goals of design, the designer must be aware with such design constraints and more importantly, the factors that have a direct effect on them.One of the challenges facing embedded system designers is the selection of the optimum processor for the application in hand; single-purpose, general-purpose or application specific. Microcontrollers are one member of the family of the application specific processors.The book concentrates on the use of microcontroller as the embedded system?s processor, and how to use it in many embedded system applications. The book covers both the hardware and software aspects needed to design using microcontroller.The book is ideal for undergraduate students and also the engineers that are working in the field of digital system design.Contents• Preface;• Process design metrics;• A systems approach to digital system design;• Introduction to microcontrollers and microprocessors;• Instructions and Instruction sets;• Machine language and assembly language;• System memory; Timers, counters and watchdog timer;• Interfacing to local devices / peripherals;• Analogue data and the analogue I/O subsystem;• Multiprocessor communications;• Serial Communications and Network-based interfaces

Applications in Electronics Pervading Industry, Environment and Society

This book features the manuscripts accepted for the Special Issue “Applications in Electronics Pervading Industry, Environment and Society—Sensing Systems and Pervasive Intelligence” of the MDPI journal Sensors. Most of the papers come from a selection of the best papers of the 2019 edition of the “Applications in Electronics Pervading Industry, Environment and Society” (APPLEPIES) Conference, which was held in November 2019. All these papers have been significantly enhanced with novel experimental results. The papers give an overview of the trends in research and development activities concerning the pervasive application of electronics in industry, the environment, and society. The focus of these papers is on cyber physical systems (CPS), with research proposals for new sensor acquisition and ADC (analog to digital converter) methods, high-speed communication systems, cybersecurity, big data management, and data processing including emerging machine learning techniques. Physical implementation aspects are discussed as well as the trade-off found between functional performance and hardware/system costs

Experimental Benchmarks and Initial Evaluation of the Performance of the PASM System Prototype

The work reported here represents experiences with the PASM parallel processing system prototype during its first operational year. Most of the experiments were performed by students in the Fall semester of 1987. The first programming, and the first timing measurements, were made during the summer of 1987 by Sam Fineberg. The goal of the collection of experiments presented here was to undertake an Application-driven Architecture Study of the PASM system as a paradigm for parallel architecture evaluation in general. PASM was an excellent vehicle for experimenting with this evaluation technique due to its unique architectural features. Among these are: 1. A reconfigurable, partitionable multistage circuit-switched network. 2. Support for both SIMD and MIMD programs. 3. Ability to execute hybrid SIMD/MIMD programs. 4. An instruction queue which allows overlap of control-flow and data manipulation between micro-control (MC) units and processing elements (PE). It had been hypothesized that superlinear speed-up over the number of PEs could be attained with this feature, and experimental results verified this. 5. Support for barrier synchronization of MIMD tasks. This feature was exploited in some non-standard ways to show the ability to decouple variant length SIMD instructions into multiple MIMD streams for an overall performance benefit. This type of study is expected to continue in the future on PASM and other parallel machines at Purdue. This report should serve as a guide for this future work as well