NASA Tech Briefs Index, 1978

Approximately 601 announcements of new technology derived from the research and development activities of the National Aeronautics and Space Administration are presented. Emphasis is placed on information considered likely to be transferrable across industrial, regional, or disciplinary lines. Subject matter covered includes: electronic components and circuits; electron systems; physical sciences; materials; life sciences; mechanics; machinery; fabrication technology; and mathematics and information sciences

Prognostics and health management of power electronics

Prognostics and health management (PHM) is a major tool enabling systems to evaluate their reliability in real-time operation. Despite ground-breaking advances in most engineering and scientific disciplines during the past decades, reliability engineering has not seen significant breakthroughs or noticeable advances. Therefore, self-awareness of the embedded system is also often required in the sense that the system should be able to assess its own health state and failure records, and those of its main components, and take action appropriately. This thesis presents a radically new prognostics approach to reliable system design that will revolutionise complex power electronic systems with robust prognostics capability enhanced Insulated Gate Bipolar Transistors (IGBT) in applications where reliability is significantly challenging and critical. The IGBT is considered as one of the components that is mainly damaged in converters and experiences a number of failure mechanisms, such as bond wire lift off, die attached solder crack, loose gate control voltage, etc. The resulting effects mentioned are complex. For instance, solder crack growth results in increasing the IGBT’s thermal junction which becomes a source of heat turns to wire bond lift off. As a result, the indication of this failure can be seen often in increasing on-state resistance relating to the voltage drop between on-state collector-emitter. On the other hand, hot carrier injection is increased due to electrical stress. Additionally, IGBTs are components that mainly work under high stress, temperature and power consumptions due to the higher range of load that these devices need to switch. This accelerates the degradation mechanism in the power switches in discrete fashion till reaches failure state which fail after several hundred cycles. To this end, exploiting failure mechanism knowledge of IGBTs and identifying failure parameter indication are background information of developing failure model and prognostics algorithm to calculate remaining useful life (RUL) along with ±10% confidence bounds. A number of various prognostics models have been developed for forecasting time to failure of IGBTs and the performance of the presented estimation models has been evaluated based on two different evaluation metrics. The results show significant improvement in health monitoring capability for power switches.Furthermore, the reliability of the power switch was calculated and conducted to fully describe health state of the converter and reconfigure the control parameter using adaptive algorithm under degradation and load mission limitation. As a result, the life expectancy of devices has been increased. These all allow condition-monitoring facilities to minimise stress levels and predict future failure which greatly reduces the likelihood of power switch failures in the first place

NASA Tech Briefs Index 1978

Tech Briefs are short announcements of new technology derived from the research and development activities of the National Aeronautics and Space Administration. These briefs emphasize information considered likely to be transferrable across industrial, regional, or disciplinary lines and are issued to encourage commercial application. This Index to NASA Tech Briefs contains abstracts and four indexes -- subject, personal author, originating Center, and Tech Brief number -- for 1978 Tech Briefs

Cumulative index to NASA Tech Briefs, 1986-1990, volumes 10-14

Tech Briefs are short announcements of new technology derived from the R&D activities of the National Aeronautics and Space Administration. These briefs emphasize information considered likely to be transferrable across industrial, regional, or disciplinary lines and are issued to encourage commercial application. This cumulative index of Tech Briefs contains abstracts and four indexes (subject, personal author, originating center, and Tech Brief number) and covers the period 1986 to 1990. The abstract section is organized by the following subject categories: electronic components and circuits, electronic systems, physical sciences, materials, computer programs, life sciences, mechanics, machinery, fabrication technology, and mathematics and information sciences

Index to NASA Tech Briefs, 1972

Abstracts of 1972 NASA Tech Briefs are presented. Four indexes are included: subject, personal author, originating center, and Tech Brief number

NASA SBIR abstracts of 1990 phase 1 projects

The research objectives of the 280 projects placed under contract in the National Aeronautics and Space Administration (NASA) 1990 Small Business Innovation Research (SBIR) Phase 1 program are described. The basic document consists of edited, non-proprietary abstracts of the winning proposals submitted by small businesses in response to NASA's 1990 SBIR Phase 1 Program Solicitation. The abstracts are presented under the 15 technical topics within which Phase 1 proposals were solicited. Each project was assigned a sequential identifying number from 001 to 280, in order of its appearance in the body of the report. The document also includes Appendixes to provide additional information about the SBIR program and permit cross-reference in the 1990 Phase 1 projects by company name, location by state, principal investigator, NASA field center responsible for management of each project, and NASA contract number

Health Condition Assessment of Multi-Chip IGBT Module with Magnetic Flux Density

To achieve efficient conversion and flexible control of electronic energy, insulated gate bipolar transistor (IGBT) power modules as the dominant power semiconductor devices are increasingly applied in many areas such as electric drives, hybrid electric vehicles, railways, and renewable energy systems. It is known that IGBTs are the most vulnerable components in power converter systems. To achieve high power density and high current capability, several IGBT chips are connected in parallel as a multi-chip IGBT module, which makes the power modules less reliable due to a more complex structure. The lowered reliability of IGBT modules will not only cause safety problems but also increase operation costs due to the failure of IGBT modules. Therefore, the reliability of IGBTs is important for the overall system, especially in high power applications. To improve the reliability of IGBT modules, this thesis proposes a new health state assessment model with a more sensitive precursor parameter for multi-chip IGBT module that allows for condition-based maintenance and replacement prior to complete failure. Accurate health condition monitoring depends on the knowledge of failure mechanism and the selection of highly sensitive failure precursor. IGBT modules normally wear out and fail due to thermal cycling and operating environment. To enhance the understanding of the failure mechanism and the external characteristic performance of multi-chip IGBT modules, an electro-thermal finite element model (FEM) of a multi-chip IGBT module used in wind turbine converter systems was established with considerations for temperature dependence of material property, the thermal coupling effect between components, and the heat transfer process. The electro-thermal FEM accurately performed temperature distribution and the distribution electrical characteristic parameters during chip solder degradation. This study found an increased junction temperature, large change of temperature distribution, and more serious imbalanced current sharing during a single chip solder aging, thereby accelerating the aging of the whole IGBT module. According to the change of thermal and electrical parameters with chip solder fatigue, the sensitivity of fatigue sensitive parameters (FSPs) was analyzed. The collector current of the aging chip showed the highest sensitivity with the chip solder degradation compared with the junction temperature, case temperature, and collector-emitter voltage. However, the current distribution of internal components remains inaccessible through direct measurements or visual inspection due to the package. As the relationship between the current and magnetic field has been studied and gradually applied in sensor technologies, magnetic flux density was proposed instead of collector current as a new precursor for health condition monitoring. Magnetic flux density distribution was extracted by an electro-thermal-magnetic FEM of the multi-chip IGBT module based on electromagnetic theory. Simulation results showed that magnetic flux density had even higher sensitivity than collector current with chip solder degradation. In addition, the magnetic flux density was only related with the current and was not influenced by temperature, which suggested good selectivity. Therefore, the magnetic flux density was selected as the precursor due to its better sensitivity, selectivity, and generality. Finally, a health state assessment model based on backpropagation neural network (BPNN) was established according to the selected precursor. To localize and evaluate chip solder degradation, the health state of the IGBT module was determined by the magnetic flux density for each chip and the corresponding operating conduction current. BPNN featured good self-learning, self-adapting, robustness and generalization ability to deal with the nonlinear relationship between the four inputs and health state. Experimental results showed that the proposed model was accurate and effective. The health status of the IGBT modules was effectively recognized with an overall recognition rate of 99.8%. Therefore, the health state assessment model built in this thesis can accurately evaluate current health state of the IGBT module and support condition-based maintenance of the IGBT module

In-situ health monitoring of IGBT power modules in EV applications

Power electronics are an enabling technology and play a critical role in the establishment of an environmentally-friendly and sustainable low carbon economy. The electrification of passenger vehicles is one way of achieving this goal. It is well acknowledged that Electric vehicles (EVs) have inherent advantages over the conventional internal combustion engine (ICE) vehicles owing to the absence of emissions, high efficiency, and quiet and smooth operation. Over the last 20 years, EVs have improved significantly in their system integration, dynamic performance and cost. It has attracted much attention in research communities as well as in the market. In 2011 electric vehicle sales were estimated to reach about 20,000 units worldwide, increasing to more than 500,000 units by 2015 and 1.3 million by 2020 which accounts for 1.8 per cent of the total number of passenger vehicles expected to be sold that year. In general, electric vehicles use electric motors for traction drive, power converters for energy transfer and control, and batteries, fuel cells, ultracapacitors, or flywheels for energy storage. These are the core elements of the electric power drive train and thus are desired to provide high reliability over the lifetime of the vehicle. One of the vulnerable components in an electric power drive train is the IGBT switching devices in an inverter. During the operation, IGBT power modules will experience high mechanical and thermal stresses which lead to bond wire lift-off and solder joint fatigue faults. Theses stresses can lead to malfunctions of the IGBT power modules. A short-circuit or open-circuit in any of the power modules may result in an instantaneous loss of traction power, which is dangerous for the driver and other road users. These reliability issues are very complex in their nature and demand for the development of analytical models and experimental validation. This work is set out to develop an online measurement technique for health monitoring of IGBT and freewheeling diodes inside the power modules. The technique can provide an early warning prior to a power device failure. Bond wire lift-off and solder fatigue are the two most frequently occurred faults in power electronic modules. The former increases the forward voltage drop across the terminals of the power device while the latter increase the thermal resistance of the solder layers. As a result, bond wire lift-off can be detected by a highly sensitive and fast operating in-situ monitoring circuit. Solder joint fatigue is detected by measuring the thermal impedance of the power modules. This thesis focuses on the design and optimisation of the in-situ health monitoring circuit in an attempt to reducing noise, temperature variations and measurement uncertainties. Experimental work is carried out on a set of various IGBT power modules that have been modified to account for different testing requirements. Then the lifetime of the power module can be estimated on this basis. The proposed health monitoring system can be integrated into the existing IGBT driver circuits and can also be applied to other applications such as industrial drives, aerospace and renewable energy.EThOS - Electronic Theses Online ServiceORSSchool of EEEGBUnited Kingdo

In-situ health monitoring of IGBT power modules in EV applications

Power electronics are an enabling technology and play a critical role in the establishment of an environmentally-friendly and sustainable low carbon economy. The electrification of passenger vehicles is one way of achieving this goal. It is well acknowledged that Electric vehicles (EVs) have inherent advantages over the conventional internal combustion engine (ICE) vehicles owing to the absence of emissions, high efficiency, and quiet and smooth operation. Over the last 20 years, EVs have improved significantly in their system integration, dynamic performance and cost. It has attracted much attention in research communities as well as in the market. In 2011 electric vehicle sales were estimated to reach about 20,000 units worldwide, increasing to more than 500,000 units by 2015 and 1.3 million by 2020 which accounts for 1.8 per cent of the total number of passenger vehicles expected to be sold that year. In general, electric vehicles use electric motors for traction drive, power converters for energy transfer and control, and batteries, fuel cells, ultracapacitors, or flywheels for energy storage. These are the core elements of the electric power drive train and thus are desired to provide high reliability over the lifetime of the vehicle. One of the vulnerable components in an electric power drive train is the IGBT switching devices in an inverter. During the operation, IGBT power modules will experience high mechanical and thermal stresses which lead to bond wire lift-off and solder joint fatigue faults. Theses stresses can lead to malfunctions of the IGBT power modules. A short-circuit or open-circuit in any of the power modules may result in an instantaneous loss of traction power, which is dangerous for the driver and other road users. These reliability issues are very complex in their nature and demand for the development of analytical models and experimental validation. This work is set out to develop an online measurement technique for health monitoring of IGBT and freewheeling diodes inside the power modules. The technique can provide an early warning prior to a power device failure. Bond wire lift-off and solder fatigue are the two most frequently occurred faults in power electronic modules. The former increases the forward voltage drop across the terminals of the power device while the latter increase the thermal resistance of the solder layers. As a result, bond wire lift-off can be detected by a highly sensitive and fast operating in-situ monitoring circuit. Solder joint fatigue is detected by measuring the thermal impedance of the power modules. This thesis focuses on the design and optimisation of the in-situ health monitoring circuit in an attempt to reducing noise, temperature variations and measurement uncertainties. Experimental work is carried out on a set of various IGBT power modules that have been modified to account for different testing requirements. Then the lifetime of the power module can be estimated on this basis. The proposed health monitoring system can be integrated into the existing IGBT driver circuits and can also be applied to other applications such as industrial drives, aerospace and renewable energy.EThOS - Electronic Theses Online ServiceORSSchool of EEEGBUnited Kingdo

NASA Tech Briefs, December 1990

Topics: New Product Ideas; NASA TU Services; Electronic Components and Circuits; Electronic Systems; Physical Sciences; Materials; Computer Programs; Mechanics; Machinery; Fabrication Technology; Mathematics and Information Sciences; Life Sciences