1 research outputs found
An Embedded Rectifier-Based Built-In-Test Circuit for CMOS RF Circuits
Built-In-Test (BIT) for Radio Frequency Integrated
Circuits (RFIC) is an effective method to reduce the testing
cost, especially with the increase of integration level and
operating frequency. In this work, a fully integrated CMOS
BIT methodology is proposed. The BIT circuit used is rectifierbased
and gate-source connected MOS transistor with
Substrate Positively-Biased (SPB) scheme is used to further
improve the detecting sensitivity. With little current
consumption, high input impedance and high frequency
scalability this circuit can predict complex high frequency
performances of RF circuits such as gain, operating frequency,
bandwidth and linearity. Besides, the influence of Process,
supply Voltage, and Temperature (PVT) variations on the
performance of RF circuits can also be monitored by using this
BIT circuit