An Optimal Algorithm for Detecting Pattern Sensitive Faults in Semiconductor Random Access Memories

Random-access memory (RAM) testing to detect unrestricted pattern-sensitive faults (PSFs) is impractical due to the size of the memory checking sequence required. A formal model for restricted PSFs in RAMs called adjacent-pattern interference faults (APIFs) is presented. A test algorithm capable of detecting APIFs in RAMs requiring a minimum number of memory operations is then developed