We present a technique to accurately characterize the frequency response of high frequency on-chip continuous-time filters. When compared to conventional methods of measurement, the proposed technique shows two orders of magnitude improvement in accuracy. Experimental results are shown for a 75 MHz fifth order Chebyshev Gm-C ladder filter designed in a 0.35 µm CMOS process and packaged in a 40 pin dual-in-line package. 1