Analog and mixed-signal design and test techniques for improved reliability

The relentless evolution of semiconductor technology has led to a pervasive reliance on integrated circuits (ICs) across an array of applications, from consumer electronics to safety-critical systems in automotive and medical devices. Ensuring the reliability and robustness of these ICs has become paramount. This dissertation addresses the growing need for defect-oriented testing in analog and mixed-signal (AMS) circuits, introducing a novel digital-like methodology. It emphasizes breaking down complex AMS circuits into smaller, manageable subcircuits, which are rigorously examined using purely digital monitors and injectors. The methodology is resource-efficient, optimizing existing circuit resources to minimize area overhead and power consumption. A significant achievement lies in the development of a Built-In Self-Test (BIST) for a 12-bit Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC), showcasing the approach's effectiveness and flexibility. Additionally, this dissertation pioneers a smart sensor design approach that reduces dependence on intricate device models, thereby ensuring high performance across a broad range of operating conditions. A case study on a temperature-to-digital converter (TDC) design demonstrates its capability to function reliably over an extensive temperature range. The methodology optimizes parameters, allowing energy-efficient sensor designs that meet industry standards while minimizing silicon area and power consumption. These works signify a dedicated commitment to advancing the reliability and functional safety of analog and mixed-signal circuits, contributing to the evolving landscape of IC design