Communication Subsystems for Emerging Wireless Technologies

The paper describes a multi-disciplinary design of modern communication systems. The design starts with the analysis of a system in order to define requirements on its individual components. The design exploits proper models of communication channels to adapt the systems to expected transmission conditions. Input filtering of signals both in the frequency domain and in the spatial domain is ensured by a properly designed antenna. Further signal processing (amplification and further filtering) is done by electronics circuits. Finally, signal processing techniques are applied to yield information about current properties of frequency spectrum and to distribute the transmission over free subcarrier channels

Indirect test of M-S circuits using multiple specification band guarding

Testing analog and mixed-signal circuits is a costly task due to the required test time targets and high end technical resources. Indirect testing methods partially address these issues providing an efficient solution using easy to measure CUT information that correlates with circuit performances. In this work, a multiple specification band guarding technique is proposed as a method to achieve a test target of misclassified circuits. The acceptance/rejection test regions are encoded using octrees in the measurement space, where the band guarding factors precisely tune the test decision boundary according to the required test yield targets. The generated octree data structure serves to cluster the forthcoming circuits in the production testing phase by solely relying on indirect measurements. The combined use of octree based encoding and multiple specification band guarding makes the testing procedure fast, efficient and highly tunable. The proposed band guarding methodology has been applied to test a band-pass Butterworth filter under parametric variations. Promising simulation results are reported showing remarkable improvements when the multiple specification band guarding criterion is used.Peer ReviewedPostprint (author's final draft

Real-Time Fault Detection and Diagnosis System for Analog and Mixed-Signal Circuits of Acousto-Magnetic EAS Devices

© 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.The paper discusses fault diagnosis of the electronic circuit board, part of acousto-magnetic electronic article surveillance detection devices. The aim is that the end-user can run the fault diagnosis in real time using a portable FPGA-based platform so as to gain insight into the failures that have occurred.Peer reviewe

Automatic programming methodologies for electronic hardware fault monitoring

This paper presents three variants of Genetic Programming (GP) approaches for intelligent online performance monitoring of electronic circuits and systems. Reliability modeling of electronic circuits can be best performed by the Stressor - susceptibility interaction model. A circuit or a system is considered to be failed once the stressor has exceeded the susceptibility limits. For on-line prediction, validated stressor vectors may be obtained by direct measurements or sensors, which after pre-processing and standardization are fed into the GP models. Empirical results are compared with artificial neural networks trained using backpropagation algorithm and classification and regression trees. The performance of the proposed method is evaluated by comparing the experiment results with the actual failure model values. The developed model reveals that GP could play an important role for future fault monitoring systems.This research was supported by the International Joint Research Grant of the IITA (Institute of Information Technology Assessment) foreign professor invitation program of the MIC (Ministry of Information and Communication), Korea

Realization of Analog Wavelet Filter using Hybrid Genetic Algorithm for On-line Epileptic Event Detection

© 2020 The Author(s). This open access work is licensed under a Creative Commons Attribution 4.0 License. For more information, see http://creativecommons.org/licenses/by/4.0/.As the evolution of traditional electroencephalogram (EEG) monitoring unit for epilepsy diagnosis, wearable ambulatory EEG (WAEEG) system transmits EEG data wirelessly, and can be made miniaturized, discrete and social acceptable. To prolong the battery lifetime, analog wavelet filter is used for epileptic event detection in WAEEG system to achieve on-line data reduction. For mapping continuous wavelet transform to analog filter implementation with low-power consumption and high approximation accuracy, this paper proposes a novel approximation method to construct the wavelet base in analog domain, in which the approximation process in frequency domain is considered as an optimization problem by building a mathematical model with only one term in the numerator. The hybrid genetic algorithm consisting of genetic algorithm and quasi-Newton method is employed to find the globally optimum solution, taking required stability into account. Experiment results show that the proposed method can give a stable analog wavelet base with simple structure and higher approximation accuracy compared with existing method, leading to a better spike detection accuracy. The fourth-order Marr wavelet filter is designed as an example using Gm-C filter structure based on LC ladder simulation, whose power consumption is only 33.4 pW at 2.1Hz. Simulation results show that the design method can be used to facilitate low power and small volume implementation of on-line epileptic event detector.Peer reviewe

Mixed-Signal Testability Analysis for Data-Converter IPs

In this paper, a new procedure to derive testability measures is presented. Digital testability can be calculated by means of probability, while in analog it is possible to calculate testability using impedance values. Although attempts have been made to reach compatibility, matching was somewhat arbitrary and therefore not necessarily compatible. The concept of the new approach is that digital and analog can be integrated in a more consistent way. More realistic testability figures are obtained, which makes testability of true mixed-signal systems and circuits feasible. To verify the results, our method is compared with a sensitivity analysis, for a simple 3-bit ADC

A Powerful Optimization Tool for Analog Integrated Circuits Design

This paper presents a new optimization tool for analog circuit design. Proposed tool is based on the robust version of the differential evolution optimization method. Corners of technology, temperature, voltage and current supplies are taken into account during the optimization. That ensures robust resulting circuits. Those circuits usually do not need any schematic change and are ready for the layout.. The newly developed tool is implemented directly to the Cadence design environment to achieve very short setup time of the optimization task. The design automation procedure was enhanced by optimization watchdog feature. It was created to control optimization progress and moreover to reduce the search space to produce better design in shorter time. The optimization algorithm presented in this paper was successfully tested on several design examples

Compact Structural Test Generation for Analog Macros

A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IV-converter macro design. Parameters of so-called test configurations are optimized for detection of faults in a fault-list and an optimal selection algorithm results in determining the best test set. The distribution of the results along the parameter-axes of the test configurations is investigated to identify a collapsed high-quality test se

Yield Model Characterization For Analog Integrated Circuit Using Pareto-Optimal Surface

A novel technique is proposed in this paper that achieves a yield optimized design from a set of optimal performance points on the Pareto front. Trade-offs among performance functions are explored through multi-objective optimization and Monte Carlo simulation is used to find the design point producing the best overall yield. One advantage of the approach presented is a reduction in the computational cost normally associated with Monte Carlo simulation. The technique offers a yield optimized robust circuit design solution with transistor level accuracy. An example using an OTA is presented to demonstrate the effectiveness of the work