A general software defect-proneness prediction framework

This is the author's accepted manuscript. The final published article is available from the link below. Copyright @ 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.BACKGROUND - Predicting defect-prone software components is an economically important activity and so has received a good deal of attention. However, making sense of the many, and sometimes seemingly inconsistent, results is difficult. OBJECTIVE - We propose and evaluate a general framework for software defect prediction that supports 1) unbiased and 2) comprehensive comparison between competing prediction systems. METHOD - The framework is comprised of 1) scheme evaluation and 2) defect prediction components. The scheme evaluation analyzes the prediction performance of competing learning schemes for given historical data sets. The defect predictor builds models according to the evaluated learning scheme and predicts software defects with new data according to the constructed model. In order to demonstrate the performance of the proposed framework, we use both simulation and publicly available software defect data sets. RESULTS - The results show that we should choose different learning schemes for different data sets (i.e., no scheme dominates), that small details in conducting how evaluations are conducted can completely reverse findings, and last, that our proposed framework is more effective and less prone to bias than previous approaches. CONCLUSIONS - Failure to properly or fully evaluate a learning scheme can be misleading; however, these problems may be overcome by our proposed framework.National Natural Science Foundation of Chin

Connecting Software Metrics across Versions to Predict Defects

Accurate software defect prediction could help software practitioners allocate test resources to defect-prone modules effectively and efficiently. In the last decades, much effort has been devoted to build accurate defect prediction models, including developing quality defect predictors and modeling techniques. However, current widely used defect predictors such as code metrics and process metrics could not well describe how software modules change over the project evolution, which we believe is important for defect prediction. In order to deal with this problem, in this paper, we propose to use the Historical Version Sequence of Metrics (HVSM) in continuous software versions as defect predictors. Furthermore, we leverage Recurrent Neural Network (RNN), a popular modeling technique, to take HVSM as the input to build software prediction models. The experimental results show that, in most cases, the proposed HVSM-based RNN model has a significantly better effort-aware ranking effectiveness than the commonly used baseline models