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2 research outputs found
A dynamic greedy test scheduler for optimizing probe motion in in-circuit testers
Author
Bonaria L.
Raganato M.
Sonza Reorda M.
Squillero G.
Publication venue
'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
01/01/2019
Field of study
No full text
Crossref
PORTO@iris (Publications Open Repository TOrino - Politecnico di Torino)
Automatic Generation of In-Circuit Tests for Discrete Active Components
Author
Pardo Parrado Ricardo
Publication venue
Publication date
28/08/2020
Field of study
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