Improved Orientation Sampling for Indexing Diffraction Patterns of Polycrystalline Materials

Orientation mapping is a widely used technique for revealing the microstructure of a polycrystalline sample. The crystalline orientation at each point in the sample is determined by analysis of the diffraction pattern, a process known as pattern indexing. A recent development in pattern indexing is the use of a brute-force approach, whereby diffraction patterns are simulated for a large number of crystalline orientations, and compared against the experimentally observed diffraction pattern in order to determine the most likely orientation. Whilst this method can robust identify orientations in the presence of noise, it has very high computational requirements. In this article, the computational burden is reduced by developing a method for nearly-optimal sampling of orientations. By using the quaternion representation of orientations, it is shown that the optimal sampling problem is equivalent to that of optimally distributing points on a four-dimensional sphere. In doing so, the number of orientation samples needed to achieve a indexing desired accuracy is significantly reduced. Orientation sets at a range of sizes are generated in this way for all Laue groups, and are made available online for easy use.Comment: 11 pages, 7 figure

Multimodal Image Fusion and Its Applications.

Image fusion integrates different modality images to provide comprehensive information of the image content, increasing interpretation capabilities and producing more reliable results. There are several advantages of combining multi-modal images, including improving geometric corrections, complementing data for improved classification, and enhancing features for analysis...etc. This thesis develops the image fusion idea in the context of two domains: material microscopy and biomedical imaging. The proposed methods include image modeling, image indexing, image segmentation, and image registration. The common theme behind all proposed methods is the use of complementary information from multi-modal images to achieve better registration, feature extraction, and detection performances. In material microscopy, we propose an anomaly-driven image fusion framework to perform the task of material microscopy image analysis and anomaly detection. This framework is based on a probabilistic model that enables us to index, process and characterize the data with systematic and well-developed statistical tools. In biomedical imaging, we focus on the multi-modal registration problem for functional MRI (fMRI) brain images which improves the performance of brain activation detection.PhDElectrical Engineering: SystemsUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/120701/1/yuhuic_1.pd

Advancement and applications of the template matching approach to indexing electron backscatter patterns

Electron backscatter diffraction is a well-established characterisation technique used to determine the orientation and crystal phase of a crystalline material. A pattern is formed by dynamical interaction of elections with the crystal lattice, which can be understood and simulated by using Bloch wave theory. The conventional method of indexing a diffraction pattern is to use a Hough transform to convert the lines of the pattern to points that are easily accessible to a computer. As the bands of the pattern are direct projections of the crystal planes, the interplanar angles can then be computed and compared to a look up table to determine phase and orientation. This method works well for most examples, however, is not well suited to more complex unit cells, due to the fact it ignores more subtle features of the patterns. This thesis proposes a refined template matching approach which uses efficient pattern matching algorithms, such as those used in the field of computer vision, for phase determination and orientation analysis. This thesis introduces the method and demonstrates its efficacy, as well as introducing advanced methods for pseudosymmetry analysis and phase mapping. A new metric for phase confidence is also proposed and the refined method is shown to be able to correctly determine phases and pseudosymmetric orientations. Finally, preliminary work on a direct electron detector stage is presented. Work on the development, testing the pattern centre reliability, modulation transfer and an example map is shown.Open Acces

Global optimization for accurate determination of EBSD pattern centers

Accurate pattern center determination has long been a challenge for the electron backscatter diffraction (EBSD) community and is becoming critically accuracy-limiting for more recent advanced EBSD techniques. Here, we study the parameter landscape over which a pattern center must be fitted in quantitative detail and reveal that it is both sloppy and noisy, which limits the accuracy to which pattern centers can be determined. To locate the global optimum in this challenging landscape, we propose a combination of two approaches: the use of a global search algorithm and averaging the results from multiple patterns. We demonstrate the ability to accurately determine pattern centers of simulated patterns, inclusive of effects of binning and noise on the error of the fitted pattern center. We also demonstrate the ability of this method to accurately detect changes in pattern center in an experimental dataset with noisy and highly binned patterns. Source code for our pattern center fitting algorithm is available online

Pattern Matching Analysis of Electron Backscatter Diffraction Patterns for Pattern Centre, Crystal Orientation and Absolute Elastic Strain Determination: Accuracy and Precision Assessment

Pattern matching between target electron backscatter patterns (EBSPs) and dynamically simulated EBSPs was used to determine the pattern centre (PC) and crystal orientation, using a global optimisation algorithm. Systematic analysis of error and precision with this approach was carried out using dynamically simulated target EBSPs with known PC positions and orientations. Results showed that the error in determining the PC and orientation was < 10$^{-5}$ of pattern width and < 0.01{\deg} respectively for the undistorted full resolution images (956x956 pixels). The introduction of noise, optical distortion and image binning was shown to have some influence on the error although better angular resolution was achieved with the pattern matching than using conventional Hough transform-based analysis. The accuracy of PC determination for the experimental case was explored using the High Resolution (HR-) EBSD method but using dynamically simulated EBSP as the reference pattern. This was demonstrated through a sample rotation experiment and strain analysis around an indent in interstitial free steel

Diffractive triangulation of radiative point sources

We describe a general method to determine the location of a point source of waves relative to a twodimensional single-crystalline active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. The principle described here can be applied to various types of waves, provided that the detector elements are suitably structured. As a prototypical practical application of the general detection principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This approach provides a promising alternative method to calibrate Kikuchi patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions