XRF topography information: Simulations and data from a novel silicon drift detector system

Kourousias, G.; Billè, F.; Cautero, G.; Bufon, J.; Rachevski, A.; Schillani, S.; Cirrincione, D.; Altissimo, M.; Menk, R. H.; Zampa, G.; Zampa, N.; Rashevskaya, I.; Borghes, R.; Gandola, M.; Picciotto, A.; Borghi, G.; Ficorella, F.; Zorzi, N.; Bellutti, P.; Bertuccio, G.; Vacchi, A.; Gianoncelli, A.

oai:cris.fbk.eu:11582/316805

XRF topography information: Simulations and data from a novel silicon drift detector system

Authors: G. Kourousias
F. Billè
G. Cautero
J. Bufon
A. Rachevski
S. Schillani
D. Cirrincione
M. Altissimo
R. H. Menk
G. Zampa
N. Zampa
I. Rashevskaya
R. Borghes
M. Gandola
A. Picciotto
G. Borghi
F. Ficorella
N. Zorzi
P. Bellutti
G. Bertuccio
A. Vacchi
A. Gianoncelli
Publication date: 1 January 2019
Publisher
Doi

Abstract

This work presents the latest findings of an ongoing research project where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system deployed on the TwinMic beamline (Elettra Sincrotrone Trieste, Trieste, Italy)

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Archivio della ricerca - Fondazione Bruno Kessler

oai:cris.fbk.eu:11582/316805

Last time updated on 03/09/2019

This paper was published in Archivio della ricerca - Fondazione Bruno Kessler.

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