Testing VLSl chips presents a variety of problems. some of which can be solved by building on-chip testing\ud structures. On-chip testing structures can allow a designer to test aspects of a circuit which might be difficult to\ud test even with expensive test equipment and moreover can provide reasonable testing hardware to designers who\ud do not have access to sophisticated off-chip testing equipment.\ud \ud In this paper we describe a type of on-chip test structure called H timing sampler which enables the designer to\ud accurately measure when on-chip signal transitions occur. The timing samplers we present are simple. They\ud have been fabricated as part of a multi-project chip and experimental results show that they arc reasonably\ud accurate as well
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